Among the industry "firsts" that Advantest has pioneered: 

In 1979, Advantest introduced the world's first high-speed logic test system operating at 100 MHz compared with the then available 10-20 MHz systems.

In 1984, Advantest's T3998 became the first 8-device parallel test handler in the industry.

In 1987, Advantest achieved the industry's fastest, most efficient and most cost-effective memory testing by introducing high speed T5381 100 MHz parallel tester with an integrated handling capability.

In 1987, Advantest introduced its E-beam System for testing of silicon in initial fabrication, pre-production stages of manufacture, and moving the concept of testing to the "front-end" of the silicon cycle.

In 1987, Advantest introduced the T6682 VLSI test system, the industry's first 1 GHz high performance VLSI logic test system.

In 1993, Advantest introduced the T6691, the first universal 500 MHz / l GHz tester for high-performance characterization.

In 1994, Advantest debuted the new small-footprint, low-cost T3316 Parallel Logic Test System, a cost-effective test solution for meeting the high-volume demands of the 8-bit and 16-bit micro controller markets.

In 1994, Advantest introduced its new generation of logic testers, the T6600 series, designed with Advantest's groundbreaking implementation of CMOS technology.

In 1995, Advantest introduced the first of its new generation of memory testers, the T5581 250 MHz Memory Test System, is the industry's fastest production tester for state-of-the-art devices such as SSRAMs and SDRAMs.

In 1997, Advantest introduced the T6671 E, the industry's lowest cost, full-featured 125/250 MHz VLSI test system targeted at high pin count logic and mixed signal devices.

In 1997, Advantest introduced the T5591 memory tester, capable of at-speed 1 GHz / 500 MHz testing of ultra-high-speed memory devices, including synchronous DRAMs using SLDRAM and RDRAM device protocols.

In 1998, Advantest introduced the T6682 VLSI test system, the industry's first 1 GHz high performance VLSI logic test system.

In 1999, Advantest's T5585 high-speed memory test system for DDR-SDRAM and SSRAM offered the capability for simultaneous testing of 128 devices at 500 MHz.

In 1999, Advantest introduced the T6672, the performance leader in its class for high-volume production testing of ASIC and SOC devices.

In 1999, Advantest's T5371 70 MHz test solution for flash memory test became the industry's dominant flash tester for back-end processing.

In 2000, Advantest began shipment of its T5592 tester for mass production of Direct Rambus DRAM. The T5592 simultaneously tests 64 devices at 1.066 GHz.

In 2001, Advantest introduced its T5375 test system for high-throughput testing of 300 mm front-end DRAMs and high-speed back-end flash memories.

In 2001, Advantest debuted its T6600 family of SoC test solutions, offering cross platform compatibility in systems from entry level to high speed production.

In 2001, Advantest's T5771 flash memory test system gave the industry a high-throughput solution for flash memory wafer test.

In 2001, Advantest listed on the NYSE under ‘ATE’.

In 2001, Advantest's M4541AD dynamic test handler for SoC and other high-end logic devices offered parallel test of up to eight devices, testing up to 6,000 devices per hour.

In 2002, Advantest's CertiMAX broke new ground in silicon design validation by allowing design data to be used directly on the tester without vector or timing translation.

In 2002, Advantest was a founding member of the Semiconductor Test Consortium (STC) - the first international, industry-wide collaboration aimed at reducing test costs of complex logic devices, such as systems-on-chip (SoCs).

In 2002, Advantest launched the T5593 and M6542AD test cell, the industry's first comprehensive low-cost, high-precision back-end testing solution for DDR2-SDRAM, a next-generation double-data-rate (DDR) memory technology.

In 2003, the Semiconductor Test Consortium (STC) was incorporated as a nonprofit organization, and the STC released the first draft of the specifications for OPENSTAR^™, the Open Semiconductor Test Architecture.

In 2003, Advantest introduced the T2000 Series - the world’s first line of automated test equipment compliant with the OPENSTAR™ specification.

In 2003, Advantest introduced the T5377 memory test system, the industry’s first memory tester capable of testing up to 256 memory devices simultaneously.

In 2003, Advantest launched the Advantest Self Service Portal (ASSP), an e-Business suite of online tools and services, which enable customers to receive information, service and support in a timely, efficient and secure manner.

In  2004, Advantest Corporation celebrated the 50th anniversary of its founding.