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Former Verigy Ltd. Website Message from President and CEO
Committed to the cutting-edge research and development, Advantest employees publish papers on the latest hot issues in testing in the world's premier conferences and journals. These papers present state-of-the-art methodologies and solutions for SoC, embedded memories, high-speed analog/mixed-signal circuits, tester architecture and test development. The concepts described in these papers solve the burning problems and are beneficial to the whole semiconductor industry.
  
A High Density Small Size RF Test Module for High Throughput Multiple Resource Testing
  
MIMO challenges existing ATE
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