GS Main Frame Features

• Test system based on a small, space-saving mainframe and 13-module slot test head.
• System offers great flexibility and expandability since test modules are populated in an as-needed- by-application basis.
• High device test throughput is assured by optimized controller architecture design.
• The device interface features a large layout area that symmetrically distributes many high-speed, high-accuracy pins.
• Richly featured T2000 test modules can be installed to meet your multi-site SoC application.
• Connection can be easily made to a handler, prober and manipulator.
• Low power consumption design, optimizing environmental considerations, and resulting in reduced operating costs.