Advantest’s dynamic test handler, the M6241, for memory devices such as DDR2/3-SDRAM offers parallel test for up to 512 devices and boasts a throughput of 20,000 units per hour. Its compact design and new features, including an advanced heating mechanism to increase thermal stability, combine to offer significant cost reductions for volume production of today’s multi-purpose memory devices. Furthermore, with improved device transfer mechanisms, the M6241 slashes test process time and jam rates, enabling more efficient testing and greater yields.
The markets for personal computers and consumer electronics such as cellular phones and handheld computers are steadily expanding, and product functions have reached remarkable levels of sophistication. Continued high rates of growth are predicted in the multipurpose memory market, which includes DDR2-SDRAM devices used in personal computers. Demand for multipurpose memory in the consumer electronics sector is growing too, as cellular phone and digital camera functionality advances. Such increases in demand in the DRAM market for multifunctional products at lower prices mean that high-volume manufacturers of DRAM are strongly pressing for lower cost testing.
Through its improved handling and insert mechanisms, the M6241 provides highly efficient device transfer for parallel test of up to 512 units, while maintaining the compactness of its predecessor, the M6300. In fact, when used in combination with Advantest’s T5588 DRAM memory test system, parallelism is doubled, with no greater floor space required. For volume producers of today’s memory devices, this handler represents massive savings in test costs.
The M6241 is equipped with a new heating mechanism and takes just half the time of conventional models to reach target temperature. The new mechanism also controls temperature fluctuations between devices under test (DUTs), resulting in improved temperature stability.
An option for the M6241 offers customers the ability to adjust the DUT layout pitch for differences in load-board designs. This feature allows customers with changing device designs the flexibility to maximize the effective testing of their own products over time. Designed with modularity, Advantest’s M6241 incorporates a new pitch conversion kit mechanism that affords increased test efficiency and extends the life of the system. Previously, the Parallel Attachment for DUT pitch was a fixed mechanism, requiring that the handler be redesigned to accommodate changes in DUT pitch. The new M6241, with its kit mechanism, eliminates this need, giving customers increased flexibility. Recognizing that device interface design greatly impacts the efficiency of device testing, the M6241 also provides for a quick change-kit conversion between packages
Key Specifications
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Target Packages:
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BGA, CSP, TSOP1, TSOP2 etc.
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Simultaneous Testing:
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Up to 512 devices
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Throughput:
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20,000 devices per hour
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Temperature Range:
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-40°C to +125°C, -55°C to +125°C (optional)
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