The new T5781 Test System offers high test speeds of 533Mbps for tomorrow's MCPs, devices which combine multiple memory types – such as NAND, NOR and DRAM – in a single package. Complementing the T5781 is the new T5781 Engineering Station (T5781ES), which is designed for evaluation of devices and development of test programs in a developmental/laboratory environment. Combining DDR features and performance and flash functionality into a single platform, the T5781 offers both a fast turn-around development solution and high volume production test for tomorrow's memory intensive applications.

Increasing functionality of cell phones and mobile devices – which include more sophisticated features such as high-definition cameras and built-in music players – is driving the development of memory devices with expanded capacity, functionality and speed. The trend toward more functionality in mobile phones is also leading to further miniaturization of memory devices and therefore to the common use of MCPs, which contain multiple memory chips within one small package.

Conventional testing of MCPs often necessitated the use of specific test systems for specific types of memories – for example, NAND memory sub-components were tested using a unique tester specific to NAND. This results in a costly test and handling process that spans several insertions. Additionally, today's DDR-DRAM bandwidth is being incorporated into MCPs. With MCP operating speeds of more than 100MHz, demand has risen for test systems capable of testing high-speed devices with both MCP and full monolithic flash and DRAM functionality. Advantest developed the T5781 and T5781ES to meet that need.

With its at-speed performance for MCP among the best in the industry, the T5781 is well-suited to   next generation LP-DDR MCP test.

One-process, efficient testing of MCPs is now possible. Advantest     designed the T5781/T5781ES to incorporate functions to test all memory  types in an MCP on a single test system.

With test resources at each test site, including power sources and per-pin ogic and ALPG functionality, devices can be individually controlled and tested. By making the test functions independent through tester-per-site architecture, the test time for NAND and SPI flash memory is dramatically  reduced.

Having all the functional and performance qualities of the T5781, the smaller T5781ES has been designed for engineering. The two systems together provide an invaluable resource from device development to high-volume production, reducing turn-around time across the whole test and   prototyping process.