International Test Conference, Charlotte, N.C.—Sept. 30, 2003—Advantest America, Inc., a subsidiary of global semiconductor test leader Advantest Corporation (NYSE: ATE; TSE: 6857), today unveiled the T2000 Series—the industry’s first line of automated test equipment (ATE) based on the OPENSTAR™ platform recently introduced by the Semiconductor Test Consortium (STC). Advantest’s new T2000 testers are specifically designed to test systems-on-chip (SoCs) and other complex devices embedded in the full spectrum of computer, communications and consumer electronics products. Volume shipments of the first T2000 systems commence in October 2003.
Continual, rapid advancements in semiconductor technology have typically required chipmakers to purchase new ATE systems every two to three years. However, because the T2000 Series is based on a truly open, interoperable architecture, it lets chipmakers implement a cost-effective solution that adapts to their ever-changing needs. The OPENSTAR architecture, which Advantest was instrumental in helping to develop, also allows for more flexible test functionality. With its standard specifications outlined by the STC, the architecture is accessible to all test-product vendors—enabling them to provide the best possible test solutions to their customers.
Advantest’s new T2000 Series incorporates a range of features and capabilities that leverage the benefits of the OPENSTAR platform. The T2000 test systems can be easily configured for testing microprocessors, microcontrollers and radio-frequency (RF) devices by choosing from an expanding menu of test modules. Together with these modules, the T2000 enables unprecedented customization of test capabilities and delivers unmatched support for parallel testing.
Developed to meet the demands of a broad array of customers, the T2000 Series offers integrated device manufacturers (IDMs) a lower cost of test and evaluation. It also provides fabless companies a flexible platform with interchangeable modules that easily adapts to changing device requirements, and extends tester life and lowers the risk of equipment obsolescence for test houses.
According to Advantest America President and CEO Nick Konidaris, “Advantest is committed to reducing our customers’ cost of test, and the T2000 Series was developed to meet these demands. We have worked tirelessly over the past year, and we are delighted to introduce the world’s first truly open test architecture that complies with the STC specifications.”
T2000 Series Attributes
Advantest’s T2000 Series satisfies a range of test requirements through its ability to combine a variety of test modules on a single platform, including 250MHz digital modules, low- and high-current device power-supply modules, and synchronization modules (for multiple time-domain and asynchronous-functional test). The tester can thus accommodate multiple testing scenarios, including high-speed device test, at-speed test of sophisticated devices, design for test (DFT) to reduce test cost, and engineering test conducted in laboratory settings. All modules support high-speed data transfer via the OPENSTAR bus and high-speed test condition loading.
A key feature of the T2000 Series is its ability to deliver true hardware and software interoperability. The systems utilize OPENSTAR’s Open Architecture Software, which provides the common ground required for EDA and ATE companies to jointly adopt and support a variety of industry standards, together with a mainframe that hosts a dual computing architecture featuring both the system and site controllers. Multiple controllers allow for truly independent, concurrent testing of multiple devices.
The T2000 Series is highly versatile; it utilizes a Windows 2000-based operating system, while users can employ either C++ or the OPENSTAR Test Programming Language (OTPL) for their test programs. The first system in the series is capable of performing high-speed microprocessor tests with high-current device power supplies and optimizes test cost with pin/board slice architecture.
Persons interested in learning more about the new Advantest T2000 Series and the OPENSTAR platform, as well as Advantest’s full line of memory and SoC test systems, are invited to visit the company in Booth #1118 during the International Test Conference (ITC), Sept. 30-Oct. 2, at the Charlotte (N.C.) Convention Center.
Advantest Corporation is one of the world’s leading automatic test equipment suppliers to the semiconductor industry, and is also a producer of electronic and optoelectronic instruments and systems. A global company, Advantest has long offered total ATE solutions, and serves the industry in every component of semiconductor test: tester, handler, mechanical and electrical interfaces, and software. Its logic, memory, mixed-signal and RF testers, and device handlers, are integrated into the most advanced semiconductor fabrication lines in the world. Founded in Tokyo in 1954, Advantest established its North American subsidiary in 1982. Advantest America, Inc.; Advantest America R&D Center, Inc.; and Advantest Test Engineering Corporation are based in Santa Clara, Calif. Advantest America Measuring Solutions, Inc., based in Edison, N.J., distributes Advantest electronic measuring instrument products in North America. More information is available at http://www.advantest.com/