TOKYO, Japan, December 5, 2006 – Advantest Corporation (TSE: 6857, NYSE: ATE), today introduced a new low-cost OPENSTAR®-compliant test solution for the T2000, specifically designed with the compactness and modularity required to effectively test today’s high-functionality SoC consumer devices.  The T2000’s new LS mainframe will be exhibited during SEMICON Japan, December 6-8, at Chiba’s Makuhari Messe.  The new test solution which dramatically lowers test costs will be available from June 2007.

Worldwide growth in demand for consumer electronics such as DVD players and portable televisions is predicted to continue, with intensifying competition among manufacturers forcing prices downward. This in turn is pushing down the prices of the semiconductors that drive these products, despite their increased functionality and complexity.  In response to these market pressures, chip makers continually strive to lower test costs and also to find a means for eliminating the need to purchase new test systems to meet the changing demands of the devices that drive the latest cutting-edge electronics.

Solution for consumer devices offers increased parallelism with high-speed digital and analog modules
Advantest’s new low-cost test solution for consumer devices is comprised of modules that fit within the test head of the newly developed LS mainframe which is based on the T2000 open-architecture test platform. This new test solution offers high-speed digital test and analog test capability, both with enhanced parallel test capacity. Ideal for today’s high-functionality SoC consumer devices, the new solution delivers 50% greater test cost reduction and twice the parallel test capability previously available. At the same time, the new LS mainframe boasts a space-saving design that requires less floor space. Test modules are easily interchangeable to suit the type of device under test, allowing customers to employ an optimal configuration for their needs while reducing cost-of-test.

 
New module introductions testify to Advantest’s R&D strengths
For high-performance SoC consumer devices Advantest now offers an 800Mbps digital module and a 500Mbps digital module, each with 128 channels – four times greater than previously available. High-density integration techniques have enabled this greater number of channels per module.  Both modules have memory test functionality and capability to test high-function SoC devices with embedded memory.  They can also be implemented for DFT using a SCAN test capability. 

And, in recognition of the increasing range of consumer electronics applications for SoC devices, the newly developed analog test modules include the AAWGD, which supports audio frequency test, and the PMU32, which offers low-cost, high-accuracy test of ADC/DAC linearity. Each module sets a new standard of performance in analog test.

These new modules contribute to cost reductions owing to their high number of channels, allowing customers to achieve twice the parallel test capacity with less than half the previously required number of modules.

Based on the OPENSTAR® open-architecture specifications, the T2000 test system offers flexibility and adaptability unmatched in the industry. Instead of investing in new testers for each new line of products, customers may construct a test system optimally configured to their specific needs, using mainframes, test heads, and modules developed to the common standard promoted by the Semiconductor Test Consortium. The launch of its new consumer electronics test solution based on the LS mainframe heralds Advantest’s planned release of further OPENSTAR®–compliant products – an integral element of the company’s commitment to helping customers enhance their competitiveness with test solutions tailored to changing market needs.