3/05 - Test & Measurement
The IC-ATE Industry's First Open-Architecture SoC Tester

3/05 - Test & Measurement
Winning Formula for ATE Productivity

1/12/05 - Future Fab Intl. Volume 18
Benefits Of A True ‘Open Architecture Tester’ Model
By Paul Roddy, Freescale Semiconductor

1/12/05 - Future Fab Intl. Volume 18
Open Architecture Testers - Year One: Does Reality Match The Vision?
By John Johnson, Intel Corporation
Don Edenfeld, Intel Corporation
Jim Neeb, Intel Corporation

1/12/05 - Future Fab Intl. Volume 18
Solving The Open-Architecture Test Challenge?
By Rochit Rajsuman, Advantest America, Inc.