TSV Die Testing: Can we get to KGD?

Is the industry on track for achieving Known Good Die (KGD)

...... or do we settle for Probably Good Die (PGD)?

Hear it from the experts

Advantest invites you to a presentation that explores the test challenges

associated with the move toward Through Silicon Via Stacking.  What are the issues and

how do conventional test methodologies reduce the chances of achieving KGD?  At this

session we'll look at and discuss opportunities for non-conventional test methods to reach KGD.

Complimentary coffee, soft drinks and snacks served to participants of this session.

When              :          Tuesday, November 3, 2009

Time               :           3:30pm

Where            :           ITC 2009

Austin, TX Convention Center

Room 12B

SPECIAL OFFER:

Attend Advantest's presentation and receive your invitation to join our reception on

November 4 at the Moonshine Patio Bar and Grill - Austin's most innovative gathering

place for down-home food and great entertainment.

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International Test Conference, 2025 M St. NW, Suite 800
Washington, DC 20036 +1 202.973.8665