 NEWS AND INSIGHTS ON HIGH PERFORMANCE TEST SOLUTIONS FOR THE SEMICONDUCTOR INDUSTRY VOL. 2, September 2007 |
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From the Executive Suite
Over the next few weeks, Advantest will also announce three new products – a unique, far-reaching RF module and a 2G Digital Module, both part of our T2000 SoC solution set, as well as ATPG software. You can preview them here, under New Product Highlights, and can schedule a demonstration by contacting your local Advantest representative or emailing us at info@advantest.com. Thanks to those of you who stopped by Advantest’s booth at Semicon West to see the demonstration of our new integrated SoC tester-handler solution for consumer device test. To see what Test & Measurement World says about our new integrated test cell solution, visit http://www.tmworld.com/article/CA6466343.html?nid-2545. If you missed us at Semicon, see “Semicon West Recap” below and contact us at info@advantest.com to find out more. Looking forward to seeing you in Santa Clara during Test Week, and to hearing from you, R. Keith Lee TOPSemicon West Recap  Applying
our know-how of cost-effective test cell technology to revolutionize testing
of consumer-market devices, at Semicon we demonstrated just how easy testing
of today’s consumer devices can be with our all new, totally
turn-key, high-performance SoC test cell. We received excellent feedback
from customers and the press on the T2000LS mainframe/M4841 Handler test cell,
along with its high-performance interfacing and new applications. The
handler speed of 18,500 UPH plus our new Soft Touch placement technology certainly
attracted attention, as did the very small test system footprint. With
parallel testing of sixteen devices and the very high throughput (and very
low jam rate), Advantest’s compact new test cell gives new meaning
to the term ‘high-volume’ manufacturing for today’s complex
consumer devices.
At the show we introduced two new OPENSTAR® compliant modules for the T2000 that set benchmarks for high density and low cost test:
- For high speed data buses such as DDR2, our new 800MDM digital pin
module
is capable of up to 800Mbps and houses 128 channels in a single test
head slot. And, for test program development, diagnostics and yield improvement, we showed our new design-ATE-diagnostics linkage tools that offer a closed-loop ATE to EDA link to meet today’s SoC test and diagnostics challenges. For more information or to discuss your SoC testing needs, contact us at: info@advantest.comTOPPress Corner Advantest Formulates its Fourth Group Environmental Action Plan Read more » Advantest
Intros High Performance, Integrated SoC Test Cell for Consumer Devices Advantest
Demonstrates Comprehensive New Integrated Test Cell Solution For High-Volume
Consumer Market SoCs at Semicon West Advantest
and Wavecrest Co-Develop Jitter Analysis Tool for Test of Complex Internet
IC Technology Advantest
Publishes Corporate Social Responsibility Report 2007 Advantest
Again Ranks as an Overall 10 BEST Large Supplier of Chip Making Equipment
in VLSI Research Survey Advantest
Achieves 19th Consecutive Year on VLSI Research’s Annual 10 BEST Supplier
Lists Advantest
Introduces New T6373 LCD Driver Test System TOPNew Product Highlights
TOPRecent Papers and Articles: Modern SoC Handlers with Advanced Technology Lower Test Cost of Ownership, by Doug Lefever Future Fab International, July 2007 Read more » Get
Higher ATE Throughput at Lower Costs, by Doug Lefever Needed:
New Thinking for Wireless/RF Testing, by Keith Schaub A
Model for Determining ATE Cost of Ownership, by Doug Lefever Evolutionary
Changes for RF Device Testing, by Keith Schaub and Anthony Lum Upcoming Papers and Presentations: Attend ITC 2007, where Advantest will present the following papers as part of the technical program: Data
Jitter Measurement Using a Delta-Time-to-Voltage Converter Method by K. Ichiyama,
M. Ishida, T. Yamaguchi, Advantest Laboratories, and, M. Soma A
Low-Cost FFT-based Jitter Separation Method for High-Frequency Clock Testing,
by T. Yamaguchi, M. Ishida, Advantest Laboratories, H. Hou, D. Armstrong
Happenings Advantest Europe Open House Date: September 25, 2007 Place: Advantest (Europe) GmbH Read more » Advantest
America 25th Anniversary Celebration International
Test Conference Semiconductor
Test Consortium (STC) Calendar of Events Investor Information TOPTraining To find out more about Advantest’s upcoming classes and schedules or to make reservations, please contact the Advantest Training Administrator on line or by phone (408) 988-7700 or email at training@advantest.com TOPNEWSLETTER ARCHIVES Read past Advantest ATE News, click here. TOPSUBSCRIBE/UNSUBSCRIBE You received this newsletter because you are a key participant in the semiconductor industry. Please register HERE to be added to Advantest’s direct mailing list. If you would like to unsubscribe, click here: Unsubscribe@advantest.com If you think a colleague would be interested in subscribing, please forward them a copy. |
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Hello and Welcome,
