IC Test Equipment Leader Will Exhibit a Wide Spectrum of Solutions, Present at the Test Forum and Sponsor the Industry Leadership Dinner
TOKYO, Japan - January 24, 2018 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will present its innovative test solutions at SEMICON Korea on January 31-February 2 at the COEX in Seoul, South Korea. Additionally, Advantest is a platinum sponsor of SEMICON Korea and the Industry Leadership Dinner, which will take place the evening of January 31.
In Hall C, booth #510, Advantest will exhibit its advanced IC test solutions including the V93000 Wave Scale platform for next generation RF ICs, the V93000 HSM16G system for ultra-fast memory IC test and the T6391 tester for display driver ICs (DDI).
Various configurations of the T2000 platform will be featured in this year’s booth, including the T2000 AiR, a compact test cell for high-mix, low-volume system-level testing of IoT devices, the T2000 IPS for PMICs and 24-bit audio codec, and the T2000 ISS for high-speed CMOS image sensors as well as the T2000 RECT680 0.35-mm fine-pitch performance board.
Other innovative test solutions on display will include the HA7200 temperature and pressure unit paired with the EVA100 measurement system for production-volume testing of analog, digital and mixed-signal devices; the cost-effective T5851 system for high-performance universal flash storage devices and solid-state drives (SSD) and the flexible MPT3000 series of testers for SSDs. Advantest’s popular T5503 series for next-generation memory ICs used in mobile applications and servers also will be showcased.
There will be additional exhibits highlighting probe cards, high-speed memory device interfaces and e-beam metrology and lithography solutions including the F7000 e-beam lithography tool, capable of meeting resolution requirements for 1X-nm technology nodes, and the E3310, E3640 and E5610 SEM-metrology systems.
Live demonstrations, digital graphics and in-depth product presentations will provide guests with technical insights into Advantest’s newest IC test innovations and its proven solutions for the Korean market.
On Wednesday, January 31, at 1:40 p.m., Ok Su Kim of Advantest will present a technical paper on “5-Gen, RF Testing Solutions” during the Test Forum program in room 318 at the COEX.
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Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.