N6010A Serial Port Parametric Test Module from Agilent Technologies enables high-throughput parallel test at speeds of up to 12.5Gbps
TOKYO, JAPAN - October 28, 2010 - Advantest Corporation (NYSE: ATE) today announced the availability of its new high-speed interface test solution for its flagship SoC test system, the T2000. The new solution is capable of measurement at speeds up to 12.5Gbps and is enabled by the N6010A Serial Port Parametric Test Module manufactured by Agilent Technologies Inc., an industry leader in test and measurement.
Newer versions of interfaces such as PCI Express Gen3 and Ethernet boost data transfer rates many times faster than previous architectures, creating an urgent need for efficient high-speed interface test solutions. Advantest's T2000, a flexible, user-configurable test system, in conjunction with the N6010A Serial Port Parametric Test Module from Agilent, integrates rich functionality and a broad toolset, to deliver highly accurate, simultaneous multi-lane testing and characterization at data rates up to 12.5Gbps.
While measurement instruments such as oscilloscopes and Bit Error Rate Testers (BERT) have typically been deployed for characteristics evaluation of high-speed interfaces, the shift to gigabit data rates, multi-lane architectures, and the increasing integration of SoC devices has created significant measurement challenges. The new high-speed interface test solution from Advantest, combining the widely-accepted performance of the T2000 test system with Agilent's N6010A module, addresses these challenges by offering parallel test of high-speed, multi-lane interfaces. Synchronous operation comparable to the performance of Advantest's own T2000 modules delivers best-in-class throughput. The new solution facilitates system-level evaluation of complex SoC devices with integrated high-speed interfaces.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.