News News

2010-10-28 00:00:00.0 Products

High accuracy and highly parallel test capability contribute to improved throughput in cost-sensitive CMOS image sensor device production

TOKYO, JAPAN - October 28, 2010 - Advantest Corporation (NYSE: ATE) today announced that its new CMOS image sensor test solution for its flagship SoC test system, the T2000, will be available from November. The new solution enables highly accurate and massively parallel testing for CMOS image sensor devices to help customers lower their test cost.

CMOS image sensors are utilized in consumer electronics such as cellular phones, digital cameras, and video cameras, as well as automotive and other applications. As the widespread adoption of digital lifestyles in emerging economies continues to boom, CMOS image sensor demand is keeping pace. Rapid improvements in performance, speed, and resolution, as well as the diversification of multifunctional devices integrating CMOS image sensors, has led to increasing downward pressure on production costs. Advantest’s new CMOS image sensor test solution provides customers with 64-DUT parallel test capability - the highest in the industry - to significantly lower the cost of test.

Advantest’s new T2000 CMOS image sensor test solution incorporates a test head configured with a large optical source, and a new CMOS image sensor test module, providing illumination to an area greater than 10x that of Advantest’s previous product.. Most significantly, the solution offers the industry’s first 64-DUT parallel test capability for image sensor devices - 8x higher than the previous product - which results in dramatically higher throughput, contributing to significant reductions in customer test cost.

Users may customize the layout of the CMOS image sensor measurement area for individual applications by mounting components on the test site, without compromising parallelism. At 208mm x 252mm, the area of the new test head permits great flexibility in layout creation and device test.

Key Specifications

Parallel Test Capacity Max. 64 DUT
Frame Capture Speed 1.2Gbps per lane (serial)
Image Processing (Uptake Mode) Serial / parallel
No. of Channels 4 channels × 4 lanes per module
Image Data Memory 128 megapixels per channel*

∗: A maximum of 16 frames can be captured successively when data volume is 8 million pixels.

Further Enquiries

Enquiries about this product should be directed to:
Product Marketing Division at +81-3-3214-7505
Further information and complete specifications available at:
www.advantest.com/products/

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.