New T2000 GVI64 Module Performs Highly Parallel Testing of ICs for Power-Management and Automotive Applications
TOKYO, Japan - November 25, 2013 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced a new 64-channel, general purpose voltage-current (VI) module for its production-proven T2000 test platform, offering the industry's lowest cost of test for parametric testing of high-pin-count ICs used in power-management and automotive applications.
The GVI64 analog test module is designed for highly parallel, full-coverage testing of integrated device architectures that incorporate multiple functions such as power-management units, power-amp units and ADC/DAC converter units.
"With its ability to accurately test a wide range of high-density ICs, our GVI64 system delivers industry-leading productivity," said Satoru Nagumo, executive officer of Advantest Corporation. "The cost of test is minimized by the module's fast cycle times and reduced maintenance needs."
The GVI64 integrates multiple test function in a single module, including parametric, timing and linearity measurements. Other testers on today's market require several modules - along with more complex and costly performance boards/load boards, circuits and relays - to perform the same array of tests.
In addition, Advantest's new module leverages advanced digital-feedback technologies that allow it to archive and recall test results for greater accuracy, best-in-class performance and spike-free switching in parametric measurements.
The system can operate over a VI range of -64 volts to 85 volts per 240 milliamperes and a time-measurement unit range of -50 volts to 50 volts over a 100 megahertz bandwidth.
Shipments of Advantest's T2000 GVI64 module are expected to begin in the first half of 2014.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.