News News

2009-11-09 00:00:00.0 Topics

TOKYO, Japan, November 9, 2009 - Advantest Corporation (TSE: 6857, NYSE: ATE), the world's largest provider of test equipment to the global semiconductor industry, will exhibit at SEMICON Japan 2009, December 2-4, at Chiba's Makuhari Messe.
SEMICON Japan is the world's largest microelectronics manufacturing equipment and materials trade show, with an emphasis on semiconductors. Advantest will exhibit its newest test technologies under the theme of “Our Technologies, Your Success.”

Dates : Wednesday December 2 ~
Friday December 4
10:00 a.m. ~ 5:00 p.m.
Venue : Makuhari Messe, Chiba, Japan
Booth : International Exhibition Hall 8, 8C-1001


∗: For further details and registration information, please see the SEMICON Japan website:

∗: Further information about Advantest's booth exhibit is available on the company's website:

Summary of Principal Exhibits

Memory Test Technology
  • Solutions to improve throughput in front-end semiconductor manufacturing
    Advantest's T5385 memory test system helps customers to lower test costs with an industry-leading parallel test capacity of up to 768 devices.
  • Solutions to expand test function capacity in back-end semiconductor manufacturing
    Advantest offers its Enhanced Test Head to equip installed back-end test systems with greater speed and higher parallel test capacity.
  • img_nr_20091109_02
    Solutions for optimal flash memory development test

    Advantest's new B8501ES boasts a compact mainframe, low power consumption, and price ideally suited to development test needs. It features a one-chip LSI that controls all test functions.

    (image: B8501ES, Manufactured by Japan Engineering Co., Ltd.(*) )

∗: Japan Engineering Co., Ltd. is a wholly-owned subsidiary of Advantest Corporation.

Non-Memory Test Technology
  • img_nr_20091109_03

    Solutions for diverse semiconductor devices

    Advantest's T2000 test system now features an expanded range of modules that support the diversifying universe of semiconductor devices, including high-speed interfaces, RF devices, CMOS image sensors, and automotive semiconductors.


  • img_nr_20091109_04

    Solutions for analog and discrete semiconductor test

    Advantest's T7912 analog test system supports cost-sensitive, comparatively low-pin-count analog ICs and discrete semiconductors. With manufacturers facing unprecedented pressure to reduce costs, the T7912's compact mainframe, low power consumption, and competitive price help to maximize the performance of customer test strategies.

    (image: T7912)

New Test Platform

Details TBA at exhibition.

Further Enquiries

Enquiries should be directed to the Sales Promotion Department at +81-3-3214-7500

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.