TOKYO, Japan, November 9, 2009 - Advantest Corporation (TSE: 6857, NYSE: ATE), the world's largest provider of test equipment to the global semiconductor industry, will exhibit at SEMICON Japan 2009, December 2-4, at Chiba's Makuhari Messe.
SEMICON Japan is the world's largest microelectronics manufacturing equipment and materials trade show, with an emphasis on semiconductors. Advantest will exhibit its newest test technologies under the theme of “Our Technologies, Your Success.”
|Dates||:||Wednesday December 2 ~
Friday December 4
10:00 a.m. ~ 5:00 p.m.
|Venue||:||Makuhari Messe, Chiba, Japan|
|Booth||:||International Exhibition Hall 8, 8C-1001|
∗: For further details and registration information, please see the SEMICON Japan website:
∗: Further information about Advantest's booth exhibit is available on the company's website:
Summary of Principal Exhibits
Memory Test Technology
- Solutions to improve throughput in front-end semiconductor manufacturing
Advantest's T5385 memory test system helps customers to lower test costs with an industry-leading parallel test capacity of up to 768 devices.
- Solutions to expand test function capacity in back-end semiconductor manufacturing
Advantest offers its Enhanced Test Head to equip installed back-end test systems with greater speed and higher parallel test capacity.
Solutions for optimal flash memory development test
Advantest's new B8501ES boasts a compact mainframe, low power consumption, and price ideally suited to development test needs. It features a one-chip LSI that controls all test functions.
(image: B8501ES, Manufactured by Japan Engineering Co., Ltd.(*) )
∗: Japan Engineering Co., Ltd. is a wholly-owned subsidiary of Advantest Corporation.
Non-Memory Test Technology
Solutions for diverse semiconductor devices
Advantest's T2000 test system now features an expanded range of modules that support the diversifying universe of semiconductor devices, including high-speed interfaces, RF devices, CMOS image sensors, and automotive semiconductors.
Solutions for analog and discrete semiconductor test
Advantest's T7912 analog test system supports cost-sensitive, comparatively low-pin-count analog ICs and discrete semiconductors. With manufacturers facing unprecedented pressure to reduce costs, the T7912's compact mainframe, low power consumption, and competitive price help to maximize the performance of customer test strategies.
New Test Platform
Details TBA at exhibition.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.