SANTA CLARA, California, – February 7, 2012 – Advantest Corporation (TSE: 6857, NYSE: ATE) announces that Test & Measurement World Magazine has awarded its prestigious 2012 Best in Test Award in the Semiconductor Test category to Advantest’s T5773 NAND Flash Tester. The annual competition recognizes innovations that have made an especially significant contribution to the test industry. Product finalists were selected by the editors of Test & Measurement World magazine, with voting performed by the publication’s readership. The award winners were named during a ceremony held in conjunction with DesignCon 2012 on January 31, 2012, in Santa Clara, CA.
Memory Test System T5773
Advantest’s T5773 is a package test system for NAND flash memory that supports high-speed interfaces for SSDs, handsets and other applications, meeting the test needs of new device types that demand as much as 4X the test speed of previous generations. The T5773’s operating frequency range is 200MHz / 400Mbps and offers a typical parallel test capacity of 768 DUTs. Additionally, the T5773’s innovative design achieves significant power and floorspace savings, helping to lower customer test costs dramatically. Advantest also offers a compatible T5773ES, an engineering system for R&D use.
“We are honored to receive this prestigious award from Test & Measurement World magazine and equally grateful to our customers and industry peers who gave their support to the voting process. As the flash market grows with demand for smartphones, tablets, laptops and other PDAs, it is rewarding to know that the T5773 NAND Flash Tester is so highly regarded and is contributing to our customers’ business success,” commented Keith Lee, president and CEO of Advantest America, Inc.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.