Flexible, automotive IGBT test solution delivers cost, reliability, and parallel test advantages
TOKYO, Japan, – November 21, 2011 – Advantest Corporation (TSE: 6857, NYSE: ATE) today announces that Toyota Motor Corporation has adopted the company’s T2000 IGBT (Insulated Gate Bipolar Transistor) Test Solution. The selection by Toyota, the world’s leading automobile manufacturer, further affirms Advantest’s leadership position in the competitive marketplace for cost-effective, reliability test of IGBT power devices, now widely used in automotive, consumer electronics and other applications.
Semiconductors are being used in increasing numbers to enhance automotive performance in areas ranging from engine control and navigation, to communications, safety and convenience. Most recently, owing to the increasing popularity of hybrid and electric automobiles, mixed-signal devices and power management ICs are playing an even greater role in vehicle safety and intelligence, making device reliability and cost a preeminent concern for car manufacturers. Advantest’s T2000 IGBT test solution answers this call with its high-precision, mixed-signal architecture, superior reliability, and the cost-of-test advantages afforded by its multi-DUT parallel test technology.
The modular and flexible T2000 SoC test platform offers the industry’s highest levels of parallel testing capabilities for the broadest range of SoC devices including: graphics processors, MCUs, RF SoC, cellular RF, baseband, power management and audio/video devices. Capable of addressing the unique requirements of today’s complex microprocessors as well as consumer and wireless devices, the T2000 offers multi-function and high-channel density digital, analog, DC and RF instrumentation and the scalability from low to higher performance SoC device test requirements with industry leading cost of test advantages.
T2000 IGBT Test Solution
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.