V93000 Test Platform's Flexibility and Productivity Lead to Record Sales in the Past Year
TOKYO, Japan – March 16, 2015 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has shipped its 4,000th V93000 test platform, equipped with an ultra-compact A-Class test head, to Ardentec Corporation, a Taiwanese outsource test house with six production sites around the world. The milestone tester is part of a multiple-unit order that gives Ardentec a significant increase in V93000 capacity to perform wafer sorting during IC test runs.
In the past year, Advantest has sold more V93000 systems than in any previous 12-month period. As the world's most popular semiconductor test platform, the highly flexible V93000 delivers the modularity, scalability and continual innovative advancements that make it an ideal fit for OSAT customers. The tester can be custom-configured at any customer's site to ensure maximum system loading and provide the highest return on investment (ROI) for each user. It is the only test platform on the market capable of delivering these performance benefits.
"As Ardentec seeks to broaden its test business covering the whole range of applications from all major semiconductor companies, the installation of multiple V93000 A- and C-Class systems enables us to accomplish our strategic objectives," said Dr. Chi-Ming Chang, president of Ardentec Corporation.
"This customer win extends Advantest's leadership position in the global OSAT market," said Hans-Juergen Wagner, senior vice president of SoC Business Group at Advantest Corporation. "By extension, our presence in the OSAT market also benefits our fabless and outsourcing IDM (integrated device manufacturers) customers, who work closely with OSATs to meet their high-volume test needs."
Designed for testing any combination of ICs on a single platform, the V93000 system fulfills the test requirements for a large variety of customers and device types, from engineering through volume production. It is the most cost-efficient test solution for all advanced semiconductor designs including high-speed, radio-frequency, mixed-signal, analog and power ICs. With the V93000's universal per-pin architecture, each pin can run with its own clock domain, providing full test coverage by matching the exact data-rate requirements of the device under test.
The platform can be scaled to address different test methodologies and quality requirements, allowing it to adapt to changes in customers' needs over time with increases in performance, higher density boards and the addition of new applications. This flexibility gives the V93000 a long usable lifetime, providing outstanding ROI while reducing risk. In addition, Advantest's extensive test experience makes the company a proven partner for ramping up and undertaking next-generation technology challenges.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.