New Dragon Testers Selected for Their Ability to Achieve Lowest Cost of Test for a Variety of SOC Devices
TOKYO, Japan – April 11, 2013 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has installed several of its V93000 Smart ScaleTM generation testers, configured for testing system-on-chip (SOC) devices, at Powertech Technology Inc.’s (PTI) outsource semiconductor assembly and testing (OSAT) facility in Taiwan.
All of the systems in PTI's order feature Advantest’s Dragon configuration with performance capabilities including clock-domain-per-pinTM, parametric measurement units (PMU) per pin and system-like stress testing, which PTI plans to employ in testing advanced SOCs.
The order includes V93000 A-Class and C-Class configurations. The V93000 A-Class tester uses Advantest’s smallest test head, which minimizes the system’s footprint and power consumption to achieve a low cost of ownership. The C-Class system is equipped with the largest test head available for the V93000 Dragon system. All classes of V93000 Smart Scale testers are compatible, giving users the flexibility to shift semiconductor devices from one Smart Scale class to another as IC production volumes and testing needs change over time.
“To expand our testing capabilities, we needed a solution capable of handling SOCs’ demanding integration trends, which involve higher pin counts as well as the combined functionality of mixed-signal, RF (radio frequency) and high-speed digital circuitry,”
said KJ Jan, corporate officer of test for PTI.
“We also wanted a solution that would be compatible with existing single-density cards and provide a way for us to continue testing more mature devices in the most economical way possible. Advantest’s V93000 Dragon tester meets these needs, allowing us to reduce our cost of test and speed up time to market for our customers.
“ Introduced to customers in 2012, the V93000 Dragon tester is designed for maximum versatility and scalability while offering the lowest cost of test. Using up to 2,048 channels, it can test a wide range of ICs, from low-cost consumer devices to high-performance semiconductors for diverse applications. The V93000 Dragon tester is fully scalable and compatible with the proven V93000 Smart Scale platform, offering a unique combination of low cost, high pin count and flexible performance. High throughput features and advanced test capabilities enable the lowest cost of test along with superior testing accuracy and repeatability.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.