No.52 (July, 2019)
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Technical Paper
| Title/Author |
|---|
| High-resolution Time-domain Reflectometry Analysis in Back-end-of-line (BEOL) by Recursive Circuit Modelling Advantest (Singapore) Pte .Ltd. Marketing & New Product Department Yang Shang others |
Technical Description
| Title/Author |
|---|
| Development of high-voltage, high-current floating module with a maximum of 320 V and 18 channels Business Promotion Group Technology Development Division 8th R&D Department DC R&D Section 1 Shigeyuki Takeda others |
Application
| Title/Author |
|---|
| Test cell solution for reducing thermal spikes in semiconductor device testing Sales Group System Solution Division 2nd SoC System Engineering SoC SE3 Takatoshi Yoshino others |
| Verizon 5G: Test challenges for next generation of mmWave communications using V93000 WaveScale RF Advantest America, Inc. Max Seminario others |
| Test Time Analysis & Optimization on SmarTest8 Advantest China Co., Ltd. ADVANTEST Business Development&Center of Expertise, Asia Zexin Yan others |