Showcasing Broad Portfolio of Semiconductor Products, Technologies and Solutions
Shanghai, CHINA – March 10, 2015 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) will showcase its broad product portfolio, including its semiconductor test solutions, nanotechnology products and terahertz systems at SEMICON China in Hall W4, booth number 4443. The show will be held at the Shanghai New International Expo Centre in Shanghai, China, March 17-19, 2015.
Advantest will highlight its V93000 and T2000 SoC test platforms, as well as its latest test solutions, including the EVA100 system for digital and analog test in design evaluation, characterization and production; the T6391 system for testing display driver semiconductors; and the TS9000 system for non-destructive mold thickness analysis of semiconductor packaging.
Other products to be featured in Advantest’s exhibit include its MPT 3000 memory system for testing advanced solid-state drives (SSDs) and its M6245 handler for testing advanced memories with fine pitches. In addition, Advantest’s multi-vision metrology solutions, including e-beam lithography and CD-SEM metrology will be showcased in the booth.
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Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.