Automated IC handler features remote operation and thermal control to increase the productivity of semiconductor engineering labs
Today’s mobile electronics market consumes large volumes of ICs that require high power dissipation during device characterization and pre-production bring up. To test these devices, IDMs and OSATs need systems capable of cost-efficient thermal control and automated device handling. Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
Manage Device Handling from Anywhere
The M4171 brings automated device loading, unloading and binning into lab operations, improving upon the manual device handling that is prevalent today. The system can be operated remotely from any location worldwide by using a secure intranet connection. This capability maximizes equipment utilization among a company’s working groups in different locations and, by reducing the number of testers that a company needs, saves on both capital expenditures and labor costs.
Thermal Control in the Lab
This handler features an active thermal control (ATC) capability from -45° C to 125° C that is typically available only on larger, more costly production-volume handlers. Using Advantest’s Tri-Temp technology, the M4171 can operate over a wide range of temperatures, greatly increasing any lab’s efficiency.
By using direct device-surface contact, the handler can quickly adjust operating temperatures. This improves cycle temperature testing by over 40 percent compared to manual thermal-control solutions.
The versatile M4171 hander can run multi-mode test processes (single insertion multiple temperature), automated testing, automatic ID testing, output tray re-testing and manual testing, both pre-defined and user defined. It comes with a 2D code reader, a device rotator and a high contact force option. The system’s easy-to-use GUI with pre-defined functions makes operation simple.