Probo No.43 Details Probo No.43 Details

Technical Paper

A 10MHz-12GHz low-distortion high-speed SP4T switch using GaN HEMTs with oxynitride TaON passivation

Author	Advantest Laboratories, Ltd. Satoshi Koyama others
Summary	This paper describes a 10 MHz - 12 GHz low distortion high speed single pole 4 throw (SP4T) switch for RF Automated Test Equipment (ATE) using a newly developed GaN HEMT fabrication process. The switch is fabricated with the Schottky GaN HEMT process which feature very low gate leakage current with tantalum oxynitride (TaON) passivation films to improve distortion performances at low frequency. The switch has high input 3rd order intercept point (IP3) of more than 52 dBm across a frequency range of 10 MHz to 12 GHz and fast settling time of less than 10 µs to within 0.01 dB. An on-chip decode logic with TTL level input for the state control is also integrated.
Key Words	Not Specified

Development DC test technology with high additional value adopting digital controlled technology

Author	Technology Development Group 3rd R&D Department DC Core Engineering Section Takahiko Shimizu
Summary	In recent years, a lot of test condition switching regarding the range and load condition are required in multifunctional analog devices, such as Power Management IC (PMIC) and automotive device in its device test. Thus, switching time of its operation such as the mode change and the range change is getting longer at the time of changing the operation, and it's an unsolved problem to reduce test time. Furthermore, reducing settling time is another unsolved problem in the case of testing high voltage devices. In this paper, I focused on the advantage of digital control for the purpose of reducing test time, and propose the technologies which will reduce the test time.
Key Words	Digital control, hold, auxiliary current source, load identification, time varying control

Static/Dynamic Characteristics Testing for capacitive Acceleration Sensor MEMS

Author	ASD Test & Measurement System Business Group Shinichi Kimura
Summary	We have achieved acceleration sensor MEMS core wafer testing methodology which can be used for a mass production purpose, including a small capacitance measurement and a mechanical resonant frequency measurement, without any mechanical shaker systems, and even more is possible within a reasonable test time. We achieved about 10fF measurement resolution for capacitance value measurement and resonant frequency measurement.
Key Words	Acceleration sensor MEMS, small capacitance, resonant frequency, mechanical attenuation characteristics

Advanced Method to Refine Waveform Smeared by Jitter in Waveform Sampler Measurement

Author	Former System Solution Group Hideo Okawara
Summary	Impedance mismatching in transmission lines degrades the signal integrity on a DUT (Device Under Test) board. In testing high-speed digital interface devices, in order to estimate true waveform right at device output pins, so-called s-parameter de-embedding technique is often applied to compensate the amplitude loss and the waveform distortion by the board. Mixed signal ATE (Automated Test Equipment) integrates a waveform sampler for testing UHF signals. When a sampler performs under-sampling, the measured, primitive waveform is usually converted into a meaningful waveform by reshuffling the sequence of the sampled data points. This is called coherent waveform reconstruction. While performing under-sampling, slow jitter and SSC (Spread Spectrum Clocking) in the test signal have big impact on appearance of the reconstructed waveform, which is greatly blurred and you cannot recognize waveform. If you cannot reconstruct a clear waveform, the s-parameter de-embedding cannot be applied either. The purpose of this work is to remove slow jitter effects and to restore a clear waveform from a smeared waveform measured by a sampler. The test signal is a PRBS (Pseudo Random Binary Sequence) bit stream containing slow jitter or SSC. Since the PRBS signal has extremely wideband multitone spectrum, you need to make a carefully organized test plan for the sampler to reconstruct a waveform based on the coherent condition. Jitter or SSC in the signal is a kind of PM (Phase Modulation) which smears line spectra so that each line of the tones gets scattered around the original tone locations. So the point of signal processing for refining is to demodulate the PM signal and then restore the original multi-tone components. An elegant mathematical equation is introduced to perform the carrier tone recovery. Because of the multitone structure, the processing needs to be applied to each one of the tone components respectively. Firstly, the PM effect is removed from each tone, and then amplitude is compensated by referencing the original modulated tone power. Finally a clear PRBS waveform and a big open eye pattern are successfully reconstructed. This paper reports the signal processing in detail with showing 7 Gbps 127-bit PRBS waveform and some more interesting results.
Key Words	Not Specified

Author

Former System Solution Group Hideo Okawara

Summary

Impedance mismatching in transmission lines degrades the signal integrity on a DUT (Device Under Test) board. In testing high-speed digital interface devices, in order to estimate true waveform right at device output pins, so-called s-parameter de-embedding technique is often applied to compensate the amplitude loss and the waveform distortion by the board.

Mixed signal ATE (Automated Test Equipment) integrates a waveform sampler for testing UHF signals. When a sampler performs under-sampling, the measured, primitive waveform is usually converted into a meaningful waveform by reshuffling the sequence of the sampled data points. This is called coherent waveform reconstruction. While performing under-sampling, slow jitter and SSC (Spread Spectrum Clocking) in the test signal have big impact on appearance of the reconstructed waveform, which is greatly blurred and you cannot recognize waveform. If you cannot reconstruct a clear waveform, the s-parameter de-embedding cannot be applied either.

The purpose of this work is to remove slow jitter effects and to restore a clear waveform from a smeared waveform measured by a sampler. The test signal is a PRBS (Pseudo Random Binary Sequence) bit stream containing slow jitter or SSC. Since the PRBS signal has extremely wideband multitone spectrum, you need to make a carefully organized test plan for the sampler to reconstruct a waveform based on the coherent condition.

Jitter or SSC in the signal is a kind of PM (Phase Modulation) which smears line spectra so that each line of the tones gets scattered around the original tone locations. So the point of signal processing for refining is to demodulate the PM signal and then restore the original multi-tone components. An elegant mathematical equation is introduced to perform the carrier tone recovery. Because of the multitone structure, the processing needs to be applied to each one of the tone components respectively. Firstly, the PM effect is removed from each tone, and then amplitude is compensated by referencing the original modulated tone power. Finally a clear PRBS waveform and a big open eye pattern are successfully reconstructed. This paper reports the signal processing in detail with showing 7 Gbps 127-bit PRBS waveform and some more interesting results.

Key Words

Not Specified

Application

High-precision measurement technology for the terahertz wave power

Author	Terahertz System Business Division System R&D Department Technology Development and SE Section Shigeki Nishina
Summary	In general, development for various types of terahertz light source whereas is thriving recently and quantum cascade laser is one of the practical light sources. On the other hand, technology of highprecision measurement of the terahertz wave power, had been delayed. Because the standards in terahertz region are not available yet. A calorimetric power meter TAS5500 has been developed for the highly accurate power measurement of terahertz spatial beam. Calorimetric sensor technology enables to calibrate the terahertz power accurately with a measurement standard in infrared. Over a frequency range between 0.4 THz and 10 THz, this technology of power standard can provide to users with a power meter that can measure with a small uncertainty of 11% (2σ).
Key Words	Not Specified