Partnership to Develop and Market Systems that Optimize Test-Floor Operations for Greater Cost Efficiency
TOKYO, Japan and WALTHAM, Mass. – June 27, 2013 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) and Galaxy Semiconductor Solutions, a top provider of test-data analysis and yield-management software, have entered a joint development and distribution agreement for Advantest's new Test Floor Intelligence (TFI) software solutions. Advantest and Galaxy will cooperate to deliver advanced test-floor management systems that monitor and optimize test processes for both systems- and device-related issues, helping customers improve their overall equipment effectiveness (OEE). Advantest’s TFI software solutions already are being used by major fabless IC companies, outsourced semiconductor assembly and test (OSAT) facilities and semiconductor foundries.
The Advantest-Galaxy partnership offers TFI solutions that perform real-time data collection, control and web-based reporting. Customizable dashboards give test-floor managers a clear picture of tester utilization, equipment status, effective yield and other metrics. The system helps identify issues relating to the test program, interface hardware and test equipment before they impact production.
"We chose to partner with Galaxy for its expertise in a number of key areas, including fast data analytics, cross-platform data import, U/I design and web-based dashboards," said Steve Ledford, director of global production solutions marketing at Advantest. “With Galaxy's help, we are enabling our customers to get the most value from their Advantest equipment and, more broadly, from their entire test floor.”
“OEE has become a critical factor in reducing the cost of test,” said Wesley Smith, vice president of advanced technology at Galaxy. &lquo;Combining our analytics with Advantest's test-data infrastructure and global reach, we are offering a solution that gives customers actionable insight into their test operations, which can lead to an immediate improvement in OEE."
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.