Corporate Overview
Corporate Overview
Organizational Profile
(As of March 31, 2022)
| Registered Name | ADVANTEST CORPORATION |
|---|---|
| Head Office | Shin Marunouchi Center Bldg., 1-6-2, Marunouchi, Chiyoda-ku, Tokyo 100-0005 |
| Established | Dec, 1954 |
| Representative Director, President & CEO |
Yoshiaki Yoshida |
| Capital | 32,363 million yen |
| Stock Exchange Listings | Tokyo Stock Exchange, Prime Market (Securities Code: 6857) |
| Number of Shares Outstanding | 191,542,265 shares(As of September 9, 2022) |
| Number of Consolidated Affiliates | 30 (7 in Japan and 23 overseas) |
| Number of employees (including temporary employees) |
6,464 (2,724 in Japan and 3,740 overseas) |
Sales
Change in Net Sale
* Financial data are presented in accordance with International Financial Reporting Standards (IFRS).
Change in Operating Income/Operating Income Margin
* Financial data are presented in accordance with International Financial Reporting Standards (IFRS).
Change in ROE and EPS
* ROE: Return on equity ratio of net income attributed to the parent; EPS: Basic net earnings per share
Our Business Segments & Flagship Products
Advantest has three business segments: Semiconductor and Component Test Systems, which accounts for about 70% of sales; Mechatronics Systems, which handles test system peripherals; and Services, Support and Other, which mainly provides customer support and system-level test products.
In combination, these products and solutions enable us to respond to a wide variety of semiconductor test
needs and diverse customer requirements. Our broad portfolio is one of the keys to our competitiveness.
Synergistic Solution Families Centered on Semiconductor Test Systems
Semiconductor and Component Test Systems
SoC Test System
V93000
For SoC Test
T2000
For SoC Test
T6391
For Display Driver IC
Note: "SoC" stands for "System on Chip", but is here used to mean "non-memory."
Memory Test System
T5833
For DRAM/NAND Test
T5503HS2
For High-Speed DRAM Test
Semiconductor test equipment is our main product line. Our test systems are roughly divided into testers for SoC semiconductors and testers for memory semiconductors.
Testers for SoC semiconductors can test almost all devices other than memory semiconductors, such as logic semiconductors, analog semiconductors, and RF devices. The SoC semiconductor tester market is two to three times larger than the memory semiconductor tester market, and users number in the hundreds, including fabless and OSAT companies. The SoC semiconductor tester market is characterized by this large number of customers and the wide range of device types needing to be tested. Our testers for SoC semiconductors feature excellent scalability in terms of test range and test capacity, and can test a wide range of devices, from low-cost IoT devices to high-end semiconductors.
Memory semiconductor testers are optimized for the mass production of memory semiconductors, such as DRAM and NAND flash. In the memory sector, device types are less diverse, and production volumes are huge, meaning that customers seek to adopt testers capable of testing hundreds of devices at once. Our memory testers dominate this sector, as they are capable of higher speeds than the fastest devices in production today, and boast industry-best parallel test capabilities.
Mechatronics Systems
Test Handler
M4872
For SoC Test
M6242
For Memory Test
Device Interface
Change kit
HIFIX
Nanotechnology
E3650
CD-SEM For Photomask / EUV mask
Our mechatronics-related business consists of test peripherals such as device interfaces and test handlers, which are used in conjunction with test systems, and nanotechnology products used in front-end semiconductor manufacturing processes.
A device interface is a general term for devices that are electrically connected to a test system, making it possible to rapidly repurpose the test system to test diverse devices with various sizes and pin counts.
A test handler is a tool that performs the three roles of transporting semiconductor packages to the test system, applying temperature to them, and sorting semiconductors according to test results in back-end semiconductor manufacturing processes. Our handlers, test systems, and device interfaces comprise one-stop "test cells" that combine high test quality and production efficiency.
Our nanotechnology products are scanning electron microscopes that utilize our proprietary electron beam technology. They are used to measure the width and height of circuits drawn on photomasks and wafers in front-end semiconductor manufacturing processes, an area where demand is expected to increase with the spread of EUV lithography.
Services, Support and Others
Support / Services
System Level Test
MPT3000HVM
SSD Test System
ATS503x
System Level Test System
Thermal Control Unit
High-end Test Socket
Our field services business and system level test business account for the majority of sales in this segment.
Field services are not limited to maintenance of our systems. We are also expanding into high value-added services such as system utilization rate improvement, mass production ramp consulting, and security-conscious online support.
System-level test systems test semiconductors in an environment similar to that of the final product where the semiconductors will be used. It screens out defects that cannot be checked by testing the device in a stand-alone environment. We built an early position of strength in this sector through acquisitions, and are now working to grow our system-level test business through synergies with our test systems.
In addition, this segment includes Advantest Cloud Solutions™ (ACS), which enables data utilization in the semiconductor manufacturing process; second-hand product sales; and products for non-semiconductor applications such as measurement solutions for the medical and pharmaceutical fields.