Milestone System's Installation Demonstrates Advantest's Strong Position in RF SoC Testing
TOKYO, Japan – June 14, 2016 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has installed its 800th V93000 Port Scale RF test system, with the landmark unit going into the production facility of Jiangsu Changjiang Electronics Technology Co., Ltd. (JCET), a leading Chinese semiconductor packaging assembly and test company in the Jiangsu Province of China. The newly installed system is equipped with a Pin Scale 1600 digital card, Port Scale RF subsystem and MB-AV8+ analog card to meet JCET's needs in testing RF-based system-on-chip (SoC) devices and 3G/4G/LTE RF transceivers for mobile phone applications.
"JCET was an early adopter of the V93000 Port Scale RF tester when it was launched in 2007," said Bob Wang, general manager of Integrated Circuit Business Unit at JCET. "We look forward to continuing our long-standing partnership with Advantest to optimize our testing capabilities and continue to reduce costs."
"The V93000 Port Scale RF system has set the standard in RF testing and gained wide acceptance among the leading wireless device makers, including fabless semiconductor companies in China and around the world," said Hans-Juergen Wagner, senior vice president of the SoC Product Group at Advantest Corporation. "It provides high performance and high utilization, allowing us to deliver to our customers the quality and cost of test they require for their RF devices."
A member of Advantest's versatile V93000 Smart Scale™ Generation of testers, the V93000 Port Scale RF system provides greater flexibility and scalability that enables unprecedented asset utilization, manufacturing flexibility and delivers the lowest cost of test. The V93000 Port Scale RF solution covers a variety of wireless standards and can handle a broad range of devices with different levels of complexity. On the low end, it covers cost-sensitive power amplifiers and IoT devices. On the high end, it is capable of highly parallel testing of RF devices including octal-site LTE-Advanced transceivers and highly integrated RF-SoCs.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.