Cost Effective SLT Solution for High Volume Products
Evolve your SLT strategy with Advantest’s 7038 System-Level Test Platform. The 7038 is a fully automated, massively parallel, highly modular system level test platform that delivers the most cost-effective SLT solution in the industry for high volume, high test-time products.
The 7038 can test a wide variety of integrated semiconductors devices and applications, including mobile, automotive, compute/server, artificial intelligence etc., and it can verify performance and functionality in "mission mode" operation.
Fully Automatic Massively Parallel
7038 is a fully automated test cell integrated with high-speed pick & place handler to place/remove devices from test interface boards and elevators to insert/remove test interface boards from the test racks.
7038 is capable of testing up to 720 DUTs simultaneously to achieve a throughput volume of up to 5,000 units per hour (UPH), for test times around 10 minutes. A combination of optimal throughput and efficient factory floor footprint makes 7038 the industry's most cost effective SLT, for high volume and longer test time devices.
Highly Modular and Customizable
7038 is a highly modular platform, and can be customized to support products from different applications and operating conditions; the customizable features include support for Package on Package (POP) devices with top-side contacts, support for Active and Passive Thermal Controls (for room and hot temp testing), support for structural tests over HSIOs where structural tests like SCAN, LBIST, MBIST can be run on SLT and correlated with V93000/ATE Link Scale™ results, etc.
Customizable and adaptable, the 7038 performs a variety of test functions, including system-level characterization, system-level validation, system-level qualification, system-level test, burn-in test, and RMA/failure debug.
Capabilities include:
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Testing of any integrated semiconductor device: microprocessors, microcontrollers, cellular baseband SoCs, modem SoCs, and embedded systems
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Test up to 32 different work orders, each with its own test recipe of voltage, temperature, burn-in time, and more
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Real-time monitoring and logging of device temperature, current, and power
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Turnkey automation with JEDEC trays input and outputs, including lot cascading, multi-stocker binning, device rotation, and latest camera and scan options for ICs
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ActivATE™, an easy-to-use test executive software
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Competitive factory footprint with device test density
Active Temperature Control Technology (ATC)
7038 utilizes a high precision, temperature control interface for each device site. Instead of depending on uniform temperature control in a test chamber the 7038 has an Active Thermal Interposer (ATI) directly engaged with the device package. Per site air or liquid cooling is used in conjunction with the ATI and its PID control loop. This ATC architecture works together with your own device heating as it moves through test from cold start to mission mode and hot test. The result is a per site accurate temperature management system which can be used for device structural test, burn-in test, and system level test.
