Advantest Introduces New inteXcell Memory Test Cell Series
The new test cells have a compact structure that enables up to 384 simultaneous measurements per cell, for a maximum 1536-DUT parallel test capacity in a 4-cell configuration, and uses only one-third of the floor space occupied by conventional test systems.
Advantest Launches Unique AI-Powered Software Solution to Improve Wafer Test Yields
ACS EASY™ application uses AI to process vast amounts of test data to isolate and analyze the causes of yield degradation and resolve production issues in a timely fashion.
Advantest Launches XPS128+HV Power Supply Card for V93000
With per-channel voltage ranges of -10 to +24V, the new card efficiently addresses the test requirements for high-voltage devices such as USB Power Delivery components and charger functionalities in power management ICs (PMICs).