引領尖端科技Enabling
Leading-Edge Technologies

Advantest Rolls Out Pin Scale Multilevel Serial High-Speed IO Card for V93000 EXA Scale™

The Pin Scale Multilevel Serial supportsdata rates up to 32 gigabits per second (Gbps). It helps to optimize leading-edge technologies and speed time to market by providing additional test coverage for ramping of new chip designs.
Advantest Expands M4841 Handler With New "ATC 2.0" Active Thermal Control Function

ATC 2.0 provides dynamic regulation of temperature fluctuations caused by automotive semiconductors self-heating during test, helping to ensure more accurate production test in parallel with higher throughput and shorter test times.
Integrated Report 2023 Published

Advantest's Integrated Report provides a clear and concise overview of our value creation process, including management philosophy, business model and strategy, and sustainability, making it a valuable resource for a wide range of stakeholders.