EVA100

Features

1. *1
   DC-DC Converter or Voltage regulator ICs
2. *2
   AD Converter DA Converter ICs
3. *3
   MCU or Standard Logic ICs, DFT Test

Small

High Performance

Intuitive

Expandable

Support characterization, functional evaluation and mass production evaluations efficiently.

Main Functions

• EMS (Event Master Sequencer)
• AVI (Analog VI source)
• MVI (Middle power VI source)
• HVI (Floating High Voltage VI source)
• SCAP (Signal CAPture module)
• GCM (General Control)
• LF (Low Frequency AWG/Digitizer)
• HF (High Frequency AWG/Digitizer)
• SYNC (Synchronization)
• DM64 (64ch Digital Module with Analog, Power Supply Function)
• Synchronized Sequence Control (Sequence Editor)
• Protocol Support (RegisterMap)
• Profiling the Execution Time (Profiler)
• Optimizing Test Flow (Optimizer)
• Test Specification Table (Test Condition Editor)
• Documentation (ReportGenerator)

SCAP (Signal CAPture module)

4 channels high frequency sampling digitizer to observe and measure the transient response waveform or behavior from device under test (DUT).

GCM (General Control Module)

Supports digital control with protocol based commands and the control of relays and external circuitry on the performance board (PB).

LF (Low Frequency AWG and Digitizer)

The LF is an arbitrary waveform generator and waveform digitizer module covering analog measurement up to the 200kHz band width. With low distortion and low noise characteristics, it is suitable for test and evaluation of high precision devices such as audio band devices or sensor devices. The Sync Setup fully synchronizes the LF and DM (digital) modules for precise linearity test of ADC devices.

HF (High Frequency AWG and Digitizer)

The HF is an arbitrary waveform generator and waveform digitizer module covering analog measurement up to the 200MHz band width. The HF module covers a wide range of analog devices from video band to baseband band devices. The function generator and FFT analysis tools make design evaluation very efficient and productive.

Synchronized Sequence Control (Sequence Editor)

Sequence Editor makes it easy to synchronize multiple hardware channels based on how the user determines when events occur. The Sequence Editor also supports continuous measurement or conditional loop settings enabling greater control of automated measurements.

Protocol Support (RegisterMap)

I2C, SPI, JTAG I/F are supported by protocol based control. By preparing the RegisterMap, We can use the register name for digital patterns instead of neumonics so that RegisterMap gives you the very clear overview for the digital pattern and improve readability and efficiency of digital pattern debug.

Profiling the Execution Time (Profiler)

The Profiler measures the execution time of each event automatically. When the test time reduction (TTR) is needed, the detailed execution time (editable by a spreadsheet software) from the current sequence / flow can be collected by clicking the button. It provides the clear guideline for a task of TTR.

Optimizing Test Flow (Optimizer)

Wait time, relay control and power on/off control will be optimized. Without the deep knowledges and efforts by skilled engineer, the Optimizer helps to reduce the test time with keeping the test quality and results (monitoring statistical data). Support the best efficiency and productivity in a production.

Test Specification Table (Test Condition Editor)

Test Condition Editor displays the settings and conditions in sequences onto a table format. During the debugging, power supply voltages, forcing currents and limit values can be easily verified and helps to create documents (test report/condition table, etc.) after debugging.

Documentation (ReportGenerator)

The Test Conditions and Results for each measurement is reported as a HTML format which can include graphical data. Automatic report generation frees users from taking notes each time during debug sessions and exporting data, with formats such as CSV, further analysis and documentation can be performed seamlessly.

Main Specifications

Digital Unit

Synchronization

• Synchronization among Modules and Units
• Relay Control (64 user control bits)
• Hardware synchronization

Device Power Supply

• Voltage Range 7V Current Range 500mA
• Parallel operation, IDDq Measurement, VBump function

Pattern Generator

• 100MHz Pattern Generator (64ch I/O), Maximum 1024 ch
• Per Pin Parametric Measurement Unit (64ch)
• Time Measurement Unit (8ch)

Arbitrary Waveform Generator and Digitizer

• Arbitrary Waveform Generator (500ksps/18bit) (4port)
• Digitizer (500ksps/18bit) (2port)
• Reference Voltage Source (1ch)

Analog Unit

General Interface Controller

• Up to 100Mbps Pattern Generator (8ch)
• Protocol support for I2C, SPI, JTAG
• Relay Control (64 user control bits)
• Hardware synchronization

Analog VI Source

• Voltage Range +-128V Current Range +-2.0A (DC) / 5.0A (Pulse)
• Voltage Range +-64V Current Range +-500mA (DC)
• Voltage Range 1000V Current Range +-10mA (DC) / 20mA (Pulse)
• Arbitrary waveform generator, Digitizer, Differential Volts meter

Pattern Generator

• Up to 100Mbps Pattern Generator (32ch I/O)
• Low Jitter Pin (8ch I/O) / Low Jitter Clock (1ch)
• Per Pin Parametric Measurement Unit (32ch)
• Time Measurement Unit (4ch)

Precision Arbitrary Waveform Generator and Digitizer

• Arbitrary Waveform Generator (200ksps/24bit 80kHz BW) (Differential 4ch)
• Digitizer (625ksps/24bit 200kHz BW) (Differential 4ch)
• Per Pin Parametric Measurement Unit (16ch)

High Speed Arbitrary Waveform Generator and Digitizer

• Arbitrary Waveform Generator (512Msps/16bit 200MHz BW) (Differential 2ch)
• Digitizer (250Msps/16bit 200MHz BW) (Differential 2ch)
• Per Pin Parametric Measurement Unit (8ch)

Signal Capture

• 1Gbps (max. 2Gbps) Sampling (4ch)

Application and Solution samples

Application

• Measurement Items, Devices
• Tools, Options, Expansion

Solution

• Sensor Solution
• ECU Test Solution
• Production Solution
• Failure Analysis Solution

Measurement Items, Devices

I2C/SPI Communication

Support Digital Control

SCAN

Support a huge SCAN Pattern

IDDQ

Pattern controlled stand-by current measurement

VBUMP

Pattern controlled device power supply voltages

Trimming

Digital Trimming

DC-DC Converter

Characterization analog parameters i.e.) EFFI

AD Converter/DA Converter

High resolution converter evaluation

MosFET/IGBT

High Voltage leakage measurement

Please contact us from inquiry form for more details.

Tools, Options, Expansion

EDA Link tools

Pattern Generation from STIL/WGL/VCD format

Option Hardware

Support various interfaces and extension of hardware

Control external instruments

Integrate a thermal control unit, Oscilloscope and other instruments to EVA100

Please contact us from inquiry form for more details.

Sensor Solution

Atmosphere pressure, temperature, humidity Sensor (SPI/I2C)

Validation and measurement for each sensor

Angle Sensor (SENT Protocol)

Support special protocols

Test Cell Solution

Combine Pressure and Magnetic injection unit

Sensor ASIC Test Solution

ALL-In-One system for ASIC characterization

Please contact us from inquiry form for more details.

ECU Test Solution

Evaluation of ECU/Actuator

Motor control ECU

Setup communication protocol

Easy setup CAN Data from ".dbc File"

Automatic switch control and operation

Easy operation and improve test accuracy

Evaluation of various actuators

Measure & Judge Electronic Water pump

Please contact us from inquiry form for more details.

Production Solution

Launching Production Line

Support a production line launch connection to handling equipment.

Shorten TAT from design through production

After evaluation, start the production immediately.

Please contact us from inquiry form for more details.

Faliure Analysis Solution

Connecting Emission microscope

Small footprint, easy operation provide efficient evaluation system

Failure detection Solution

Realize defect chip analysis in graphical interface

Please contact us from here for more details of each solution and application.
We are glad to support you, for instance for improving evaluation tasks, establishing automatic measurement and solving troubles.
Please contact us from here.

Frequently Asked Questions

General Questions for EVA100

• QHow can I get a user account?

  A

  You can register your account as follows.

  1. 1.
     Click "Register" on the top of Advantest web page and go to registration page.
  2. 2.
     Fill in necessary information and click "Register".
  3. 3.
     Confirmation e-mail will be sent to the registered e-mail address. Click on "Confirm E-Mail".
• QWhat's the EVA100?

  A

  EVA100 (E-Model) is the system for engineering usage. E-Model connects to a laptop PC and customer projects like evaluation/characterization/debugging of analog, mixed signal ICs or modules are easily completed.

• QWhat are the benefits of EVA100?

  A

  Compact, Automation and Repeatability, Short Development Time, Easy and Intuitive Software

  • integrates VI Source, Waveform Capture functions and Device Control function into a single compact frame.
  • Measurements and evaluations can be made with intuitive operations without the need for programming language.
    The Generate Report function can dramatically increase the efficiency of tasks like data tables and figures.
  • The expandable architecture and software environment can be applied to all kinds of processes from design and evaluation to mass production and product selection. A customized, evaluation environment can be achieved by connecting EVA100 to external measurement instruments through GPIB I/F.
• QDo I need to prepare any peripherals for the EVA100?

  A

  E-Model： customers will need to prepare PC, PCIe adapter and cables.
  P-Model： customers does not need to prepare any peripherals except optional parts.

• QI would like to try EVA100. Is there any demo system available?

  A

  Yes, we can do the online demonstration and a free trial on a demo system is available.
  Please contact us for more details.

• QIs there a system for Production model?

  A

  We have P-Model for Production.
  The P-Model docks to an automatic handling system (a handler or prober) using TTL/GP-IB for testing the devices in a factory.

• QCan I use EVA100 for mass production?

  A

  The P-Model is the mass production model of the EVA100 system. After evaluating devices with the E-Model, customers can immediately start production with the P-Model. Total development time (from design to production) can be shortened dramatically.

• QWhat's the difference between E-Model and P-Model?

  A

  Maximum Number of SBs (Shoe Box) is increased to support multiple DUTS plus SEMI Safety standard are implemented on P-Model.

• QIs there any training class?

  A

  We have no pre-planned training course, however we can offer you training class at your request.

• QWe would like to ask for the application development, Is there any company we can ask?

  A

  Please contact us, we are willing to introduce you our partnership company.

System

• QWhat is the recommended PC Specification?

  A

  Here is the required PC specification for E-Model (engineering).

  CPU: >2.2GHz, 4core
  Memory: > 8GB
  HDD/SSD: > 128GB
  Display resolution: > 1366×768
  I/O: ExpressCard×1 (mandatory I/F)
  USB2.0×2, Ethernet×1

• QCan we use a desktop PC for E-Model?

  A

  Yes, PCIe Host adapter "PCIe-8361" is required for PCI slot.

• QWhat kind of configuration are available?

  A

  There are several configurations each optimized for different applications or products.
  Please contact us for more details.

• QHow noisy is the fan?

  A

  The noise level is less than 60dB.

• QAre there any accessories?

  A

  Yes, we have several accessories for high accuracy measurements and also connection kit for easy access to the evaluation board. Please contact us for more details.

• QWhat kind of power supply is needed?

  A

  E-Model: Single-phase AC power supply. Input range is 100V~240V, 50/60 Hz. The system supports automatic switching between 100 VAC and 220 VAC systems.
  P-Model: Single-phase AC 200V power supply. Input range is 200V~240V, 50/60 Hz.

• QHow often do I need system calibration?

  A

  The accuracy of internal standards is guaranteed for one year after calibration.
  In order to maintain the system accuracy, we recommend that the internal standards be calibrated every year.

• QCan the system operate modules in synchronization?

  A

  With the Hardware Sync function, customers can operate modules synchronously.
  Please refer to the EVA100_GUI_Reference_Manual for details.

• QWhen should the AVI Stack Mode be used?

  A

  The AVI's VS (Voltage Source) mode enables voltage-added output by connecting voltages of multiple channels in series. This mode can be used when the applied voltage is not enough with single channel. For example, this mode is suitable for evaluating and producing multicell battery monitoring ICs.

• QWhat is the pulse generation width of the MVI Module?

  A

  The pulse generation width of the MVI module is limited by current usage.
  For more details, refer to performance specifications.

• QHow do you use Control Bits?

  A

  Control Bits have 64 bits and can be used to control relays etc. on a PB. For the control method, please refer to the EVA100_GUI_Reference_Manual. The PB Design Guide explains how to connect control bits.

• QCan the EVA100 be used for direct control of a 12V relay?

  A

  Since the resistance of the control bits is only 5V, it does not allow direct control of a 12V relay.
  Please use the relay drive power supply (12V / 1A) on the PB.

• QCan the LF Module be used as a single end?

  A

  Yes, in between Posi-PosiGnd and Nega-NegaGnd.
  Please refer to the PB Design Guide for recommended circuits.

• QWhat are the specifications of the SB&C for the LF Module?

  A

  Please see the Standard Board and Circuit column in the Downloads section of the Advantest's website EVA100 product page.

• QWhat is the DM Module's low jitter pin 1-5-9-13-17-21-25-29 used for?

  A

  These pins have less jitter compared to other pins. Please use it according to the required performance.
  For more details, refer to performance specifications.

• QCan we use some instruments with EVA100?

  A

  Yes, it is possible.
  The instruments need to have GPIB, USB or LAN interfaces.

• QHow does EVA100 connect with external Instruments?

  A

  In case of GPIB, we use NI GPIB-USB Controller to connect between control PC and external instruments.
  The instruments are controlled through EVA100 Software.
  If external instruments support USB interface, User can control it by User Function.

Software

• QDo you support Windows10?

  A

  Yes. Microsoft Windows10 Pro (64bit) is supported after Measurement Atelier R1.50.

• QHow to get the Windows OS?

  A

  P-Model includes the EWS with preinstalled Windows OS.
  E-Model needs the preparation for PC which installed Windows 10 Pro(64bit).

• QDo I need to buy the software in addition?

  A

  No. Software is included in the system.
  What are prerequisites for the laptop computer?
  Windows 10 Pro(64bit) and Java Development Kit 64bit Version 8 are required.

• QWhich version of Java does the system require?

  A

  Less than R1.20: JDK (Java Development Kit) 7. R1.20 and above: JDK 8.

• QWhat programming language is used for test program?

  A

  A programming language is not mandatory for the Test Sequence development, it can be easily built by deploying several event icons on the GUI.

• QDo project files created with different Measurement Atelier revisions work?

  A

  Project files created with the old revision Measurement Atelier can be used with the new revision Measurement Atelier, but not the other way round.

• QCan I load a project file from batch files?

  A

  Yes, with ateliercmd. For details, refer to "Loading Project File (-load)" in the GUI Reference Manual.

• QHow can I change module configurations in Atelier Editor?

  A

  Edit "% USERPROFILE%\MeasurementAtelier\SystemConfig\SystemConfig.csv".
  For details, refer to "Setting the system configuration" in the GUI Reference Manual.

• QCan I do the Go/No-Go test?

  A

  Yes, You can set limit values for each measurement, if the measured value is out of range or not.

• QHow to add my own calculation?

  A

  You use the FUNC(user function) or SET VARIABLE on the sequence.
  Please refer to “SET VARIABLE” of the EVA100 GUI reference manual for the details of the SET VARIABLE event.
  Please refer to “EVA100 user function design guide” for user function.
  For example, we recommend that you have the function the operation of array variables, the operation of analog properties (i.e. THD, SNR, EFFI etc.)

• QHow to save the measurement result?

  A

  Judged values are displayed in the console window and you can save them as a test file. In addition, measurement results and details of test sequence (conditions, sequence) and system information can be stored as a report file.

• QHow can I set a loop inside a sequence?

  A

  Please refer to "Setting the loop" in the GUI Reference Manual.

• QIs there a Measurement Atelier that does not require an actual system?

  A

  The "EVA 100 Atelier Editor" can be used without actual equipment. Please purchase separately.

• QHow can I make a user function?

  A

  Please refer to "Creating User Function" in the EVA100 User Function Design Guide.

• QIs there any sample code of Java?

  A

  Yes, Click here for Java code reference. (Login required)

• QCan we call the external DLL?

  A

  Yes. Refer to "Calling DLL" in the EVA 100 User Function Design Guide.

• QHow do I access external files with user functions?

  A

  Please refer to "File output" in the EVA 100 User Function Design Guide.

• QWhere are the source files for user functions?

  A

  For those functions that are published, they can be downloaded from the Advantest website.

• QWhat kind of information can DM capture?

  A

  It can capture pass / fail, fail count, etc. for each cycle.
  For details, refer to Output file format (4), (5), (6) in the GUI Reference Manual.

• QCan STIL/WGL files be converted to EVA100 pattern files?

  A

  Yes, the optional software 「STIL Reader Plus for EVA100」 support the conversion.

• QWhat kind of file format is a waveform(AWG)?

  A

  Please refer to the "Waveform definition file" in the GUI Reference Manual.

• QIf the path name of the project file contains "#", it cannot be saved?

  A

  Correct. Please use path names that do not contain "#".

• QHow to install the OpenJDK?

  A

  Please refer to the "Software installation manual".

• QHow to find the Mac Address of the computer for license request?

  A

  Open the command prompt window then type the following command.

  >getmac /nh

  You can use the mac address at the first line.

• QThe service option for [ATFLEX Server R1.00] is "AUTO(delay start)" by default. Is it OK to change to "AUTO"?

  A

  Normally there is no issue, however rarely under the high loading status the server PC the license server program may fail to initially start. In this case please start it manually.
  Please refer to the "ATLEX Package Installation manual" for how to start.

• QEncountered the error message "Cannot connect to license server system, ... (Error Code:001-999-009)" during option software start up.

  A

  The following possible causes:

  1. 1.
     No access to the license server machine or license server service is not running.
     Confirm the network connection.
     Confirm the ATFLEX license server service status.
  2. 2.
     Reached the maximum license count or license has been expired.
  3. 3.
     Not registered the license file.
     Register the license file you purchased.

  Please refer to the "ATLEX Package Installation manual"

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