Optical set (optional)

Optical set

Optical stages dedicated for TAS7500TS/TAS7400TS, which achieve spectroscopic measurement (transmittance, reflectance and ATR measurements) and 2D spectroscopy/imaging (mapping) measurement.

Outline Specifications of Spectroscopic Measurement Optical Sets

Model	SHT-710068		SHT-710193	SHT-710157
Frequency band	2 THz	4 THz	7 THz	2 THz	4 THz	7 THz
Source module	TAS1120	TAS1110	TAS1130^(*1)	TAS1120	TAS1110	TAS1130^(*1)
Detector module	TAS1220	TAS1230	TAS1230	TAS1220	TAS1230
Mountable measurement module	Transmittance, Reflectance	Transmittance, Reflectance, ATR	Transmittance, Reflectance, ATR	–^(*2)
Dry air purge cover	Not required		Not required	Required^(*3)
Size (W×D×H：mm)^(*4)	450 × 220 × 290		450 × 264 × 312	870 × 490 × 220

The NA conversion optical system for spectroscopic measurements (SHT-210101) is required.
Customers should prepare an optical system for measurement.
An acrylic cover is available. Please consult with us separately for detailed specifications.
The heights are the maximum values. They may differ depending on the measurement module to be mounted, etc.

1) Terahertz spectroscopic measurement base for up to 4 THz (2 THz): SHT-710068

2) Terahertz spectroscopic measurement base for up to 7 THz: SHT-710193

This optical set can use various spectroscopic measurement modules for terahertz spectroscopic systems TAS7500 SL/SP/SU.
It does not require complicated optical adjustments and allows for easy measurement.
This compact spectroscopic module does not take time to perform dry air purge for moisture removal.
The transmittance module can also perform temperature control measurement by mounting an option (TAS1020/TAS1030).

SHT-710193 with the transmittance module (SHT-2100037) mounted

Spectroscopic measurement modules

Transmittance module
Transmittance polarization analysis module

Reflectance module

ATR module

Temperature control module
(for transmittance modules)
TAS1020/TAS1030

3) Stage for spectroscopic measurement (general-purpose type): SHT-710157

This optical set requires customers themselves to form an optical layout.
It has a wide sample and jig layout area and also allows measurements using a cryostat, etc.
The source and detector optical sections are slidable, which allows arbitrary optical layout for a transmittance or reflectance system, etc. according to the application.

Stage for spectroscopic measurement SHT-710157. The interval between the mirrors can be extended up to 300 millimeters.

Example of a measurement system using a large-sized cryostat

Terahertz Spectroscopy Imaging Optical Set: SHT-710122X04

This optical set enables 2D spectroscopy and imaging measurements by scanning samples set on the XY stage.
It can perform transmittance and reflectance measurements by switching optical layouts.
Spectroscopic measurements of large-sized samples and wide-range spectroscopy and imaging measurements are possible.
Using the provided dedicated software enables 2D mapping and spectroscopic analysis at each measurement point.

Example of reflection ratio 2D map of a conductive coating by using SHT-710122X04

Transmittance measurement mode

Reflectance measurement mode

Specifications for SHT-710122X04

Model		SHT-710122X04^(*1)
Frequency band		2 THz	4 THz	7 THz
Source module		TAS1120	TAS1110	TAS1130^(*2)
Detector module		TAS1220	TAS1230
Measurement mode		Transmittance and reflectance^(*3)
Scan range	Max.	150 mm × 150 mm
Scan resolution	Min.	0.2 mm
Scan method		Raster scan
Measurable sample size	Max.	150 mm × 150 mm, Thickness: 45 mm
Measurement time per point^(*4)	Min.	Approx. 1 s (@TAS7500TS, Resolution: 7.6 GHz, Accumulated count 1) Approx. 2 s (@TAS7400TS, Resolution: 7.6 GHz, Accumulated count 1)
Terahertz spot size		< 1 mm（2THz） < 6 mm（0.3THz）
Measurement position (height) adjustment mechanism in reflectance measurement	Stage height	Reference height: ± 5 mm (manual)
	Terahertz wave light collection height	Reference height: 0 to +40 mm (10 mm step)

The following software is required:
- Spectroscopy and imaging software (STAS14015SE-01)
- Automatic control license (PYS174-08MNIS or PYS175-08MNIS)
- Microsoft Excel 64-bit version
The NA conversion optical system for spectroscopy and imaging (SHT-210151) is required.
During reflectance measurement, the angle of incidence is fixed to 10°.
Excluding the sample travel time.