V93000 EXA Scale™

Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high-volume manufacturing. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Outsourced IDMs and fabless companies find the V93000's test capacity installed in all major OSATs worldwide.

As technology moves into the era of exascale computing, extreme test challenges arise in the areas of performance, cost-of-test, quality and time-to-volume. The EXA Scale provides cutting-edge innovations to address these challenges.

Scalable solutions extend across test heads of different sizes, including the ability to test a mix of device functions, like digital, RF, analog and power on one test system.

The V93000 EXA Scale generation renews Advantest`s commitment to platform compatibility. Existing V93000 load boards and instruments from the previous Smart Scale generation are compatible, supporting a smooth transition to the V93000 EXA Scale generation and best asset utilization. With the continued use of the proven SmarTest software, customers benefit from the installed base software infrastructure and tooling.

The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest CX-class to the largest LX-class to maximize your return-on-investment. The class determines the possible size of the configuration, allowing users to fit the size and performance of the tested device. All features and performance points are available in all classes.

All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. DUT boards can be exchanged, as well as test programs. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform.

The increasing complexity of integrated circuits (ICs), heightened power needs, higher power accuracy standards by lower VDD levels, expanded vector memory requirements, support for functional test operations, and cost of test considerations presents a multifaceted landscape of challenges for semiconductor test. Successfully navigating these challenges requires innovative approaches, collaborative efforts, and a commitment to advancing test methodologies to meet the evolving demands of the semiconductor industry.

With our digital solution, we offer a turnkey solution and expertise on socket, handling solution and load board design.

We are a market leader in digital solutions, providing exceptional power accuracy, power per system, and the most advanced per pin electronics in terms of speed. Our XPS256, XHC32, Pin Scale 5000 and Link Scale prepare us for future challenges posed by applications like AI, HPC and mobile.

The rapidly evolving wireless communications industry is challenging today’s RF solutions. Cost- of-Test and Time-to-Quality are the main drivers for RF ATE solutions to provide high parallelism and high performance as well as massive multi-site capabilities.

The V93000 Wave Scale RF (WSRF) solution addresses these requirements for RF and millimeter wave applications including Cellular 5G / 5G Advanced / NR RedCap, WiFi 6/6E/7, UWB, Bluetooth, GPS, ZigBee, WiGig, Sparklink and many other upcoming standards, across all device types, including transceivers, power amplifiers, modules and RF-SOCs.

Utilizing an advanced architecture with independent RF subsystems, based on the V93000 innovative test processor-per-pin and additional custom RF ICs, WSRF provides the necessary RF performance while offering massive parallel testing. The WSRF instrument front-end, which uses a combination of splitter and switch at its output, brings together the best of both worlds - high precision serial measurements and high throughput parallel measurements - for both transmit and receive. In addition, the environment friendly water-cooled architecture contributes to delivering industry leading RF port density, reliability, and measurement stability & repeatability for an ATE RF instrument.

The V93000 EXA Scale with its industry leading broad suite of instruments, is uniquely positioned to meet the test challenges of these integrated RF-SoC devices.

New challenges such as ADAS integration, precise battery cell monitoring & balancing, and enhanced safety features are demanding for cutting-edge microprocessors, sensors, and battery management system (BMS) chips. These ICs have unique requirements for testing and characterization. V93000 EXA Scale can test these chips due to its scalable, flexible configuration and universal instrumentation.

The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with uncompromised features such as high-density instrumentation enabling cost efficient parallel testing as well as universal per pin architecture. The floating design of the instruments enables testing of high- and low-side power structures, and the fully pattern-based operation maximizes the test throughput.

The V93000 power and analog solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. With high density cards, universal features and precision force and measurement capabilities, the power and analog solution enables leading CoT savings at high site count testing.