Memory Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS4.0 universal flash storage and PCIe Gen 5 Protocol embedded NAND, both of which are expected to be in high demand for the LTE 5G communications market.
The flexible T5851 tester is available in both production and engineering models. This allows the system to be used for reliability and qualification testing as well as test-program development or, when equipped with an automated component handler, high-volume production. As a fully integrated, system-level test solution, the T5851 provides multi-protocol support in one tool while its tester-per-DUT architecture and proprietary hardware accelerator allow it to achieve industry-leading test times.
The T5851 allows customers to minimize both their capital investments and deployment risks by using the same versatile platform and FutureSuite™ software as other members of the T5800 product line. Configuration and performance can be optimized for any DUTs and the system's modular upgradeability enhances customers' ROI well into the future.
The system's scalable, high-current programmable power supplies (PPSs) support all current and next-generation device needs. In addition, the robust module design and liquid-cooling capability give the T5851 superior reliability.
|Protocol I/F NAND, UFS
|Up to 32Gbps
|Overall Timing Accuracy
|FutureSuite OS (ATL and MPAT compatible)