新聞

2023/01/24

Events

Advantest to Showcase Latest Semiconductor Test Solutions at SEMICON Korea, February 1-3 in Seoul
2023/01/17

Events

Advantest Opens Registration for International VOICE 2023 Developer Conference, May 9-10
2023/01/10

Topics

Advantest Awarded Gold Medal in 2022 Gomez IR Site Rankings
2023/01/05

Topics

President Yoshida's 2023 New Year's Address (Abridged Version)
2022/12/28

Sustainability

3rd Biotope Video "Autumn in the Biotope" Now Available!
2022/12/22

Topics

Notice of Changes in Representative Directors
2022/12/22

Sustainability

Advantest Selected for the First Time for DJSI Asia Pacific
2022/12/09

Sustainability

Advantest Wins National Award for Factory Greening from Kanto Bureau of Economy, Trade and Industry
2022/12/07

Events

Advantest to Showcase Latest IC Test Solutions at SEMICON Japan, December 14-16 in Tokyo
2022/12/01

Products

Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-Small Photomask Defects
2022/11/29

Products

Advantest Introduces New inteXcell Series of High-Performance, Economical Test Cells for Advanced Memory ICs
2022/11/22

Products

Advantest Expands T6391 Display Driver Tester Capabilities with New Per-pin Digitizer and Comparator (LCD HP)
2022/11/22

Products

Advantest Launches Unique AI-Powered Software Solution to Accelerate Yield Improvement Throughout IC Engineering and Production
2022/11/22

Products

Hadatomo™ Z 2 New Research Achievement Articles Added
2022/11/17

Topics

Advantest Receives IR Special Award at IR Awards 2022
2022/10/25

Products

Advantest Launches Universal VI and Power Supply Card for V93000 EXA Scale SoC Test System
2022/10/21

Topics

Integrated Annual Report 2022 now Available
2022/10/21

Topics

Advantest’s Former President Hiroshi Oura Dies at 88
2022/10/05

Events

Advantest Announces Call for Papers for VOICE 2023 Developer Conference in Santa Clara, California
2022/09/20

Events

Advantest to Participate in 2022 International Test Conference in Anaheim, California