Power Semiconductor Tester Platform
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR) including the latest Wide Bandgap device technologies (Silicon carbide (SiC), Gallium nitride (GaN), etc.)
Specific tester configuration and ranges allow full coverage of device typologies reaching up to 10KV-10KA on static tests and 6KV-18KA on dynamic test.
MT Family
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR) including the latest Wide Bandgap device technologies (SiC, GaN, etc).
Specific tester configuration and ranges allow full coverage of device typologies reaching up to 10KV-10KA on static tests and 6KV-18KA on dynamic test.
Advantages and Benefits
MT tester family enables outstanding power device test coverage and CoT advantages.
Unique tester’s family able to cover all the production phases:
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Wafer sort test requirement
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Single die test requirement (KGD)
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Substrates (DBC/AMB) testing
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Packaged components, from discrete up to complex modules
Full test coverage: DC, AC and SCT test performed according to the international standards (IEC, JEDEC).
Tailored tester configurations allow to perform DC or AC (SCT) test only or combo configuration allow to perform all DC,AC and SCT with a single tester.
Up to 10kV generators, combined with up to 18kA current capability satisfy all the specific market requirements: industrial, automotive, renewal energy, railway and power grid.
Unique tester’s family able to cover all the production phases:
Full test coverage: DC, AC and SCT test performed according to the international standards (IEC, JEDEC).
Tailored tester configurations allow to perform DC or AC (SCT) test only or combo configuration allow to perform all DC,AC and SCT with a single tester.
Up to 10kV generators, combined with up to 18kA current capability satisfy all the specific market requirements: industrial, automotive, renewal energy, railway and power grid.
MT nomenclature
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S STATIC
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D DYNAMIC
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H Hi-VOLTAGE
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W Lo-CURRENT (Wafer)
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P Hi-CURREN
Manual Adopter
A manual handler is a mechanical device designed to move the unit under test into contact with the test fixture. Unlike automated systems, manual handlers do not include automatic loading or unloading features. They can be either integrated into the tester or used as standalone units.
Manual handlers are typically employed in low-volume production, prototype testing, or during the setup of new test programs, where flexibility and manual control are preferred.
COMPACT VERSION
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Small footprint, ideal for standalone use
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Designed for low-volume production, with cost-effective and simple hardware
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Includes temperature control for thermal testing requirements
INTEGRATED VERSION
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Can be integrated into MT200 tester cabinets
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Compatible with fixtures used in automated systems, enabling parallel testing setups
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Equipped with temperature control for consistent test conditions
FIXTURE SYSTEM
The Fixture System is a mechanical contact adapter designed to interface the Device Under Test (DUT) with the tester. Each adapter is customized starting from a robust, standardized base plate to ensure optimal test performance—especially for AC measurements.
STANDARD - FIXTURE
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Compatible with manual loading/unloading via CREA integrated handlers and external automatic handlers
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Available for AC-only, DC-only, or combined AC/DC testing
CUSTOM - FIXTURE
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Compatible with manual loading/unloading via CREA integrated handlers and external automatic handlers
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Available for AC-only, DC-only, or combined AC/DC testing
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Incorporates CREA LSI™ technology to minimize stray inductance to below 20 nH
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Utilizes CREA RTH™ technology, in combination with LSI™, to maintain consistent performance up to 1.5 meters away from the tester
