Device interface
Achieves Test Cost Reduction by Multiple-DUT Parallel Measurements
Advantest’s burn-in board can handle many devices running in parallel on test systems. It helps ensure device reliability and reduce testing costs. We offer a wide range of solutions tailored to target devices, and high performance and high quality measurements designed using high-precision simulation.
For FLASH ROM (B6700 is operable)
Target Devices: Raw NAND / eMMC / eMCP /UFS / PCM, etc.
For DRAM (H5620 is operable)
Target Devices: DDR / LPDDR, etc.
