T6391

The T6391 provides wide test coverage for all types of applications including analog, memory and logic circuits with high pin counts and high-speed interfaces. This versatility stems from the system's pin-card design, making it the ideal solution for both engineering and production testing.

It supports a wide range of DDIs to meet market needs now and in the future, from TDDI devices and high-precision, small-amplitude DDIs for AR/VR, to high-speed DDIs for high-end mobile devices—all essential for present and next-generation products. Using the same test programming environment as ADVANTEST’s T6300 series, a family of testers that has shaped DDI testing history, the system delivers enhanced operating efficiency across all test scenarios.

With up to 3,584 LCD channels, the T6391 enables optimal multi-site testing, supporting efficient mass production of a wide range of DDIs. Its evolving CPU and architecture deliver high throughput, while concurrent testing allows multiple functions to operate simultaneously. These capabilities reduce DDIC test time and costs, keeping the T6391 at the forefront of the industry.

In mobile and AR/VR devices, higher resolution and lower power consumption drive the need for finer and more precise voltage gradation. At the same time, increasing resolution, faster refresh rates, multi-functionality, and system miniaturization require faster, more efficient data transfer. T6391 introduces a new mode for high-accuracy grayscale testing with microvolt-range resolution. It also supports high-speed interfaces such as P2P and MIPI, as well as eDP. Together, these capabilities deliver a comprehensive test solution for cutting-edge devices.