Display Driver Test System


Tester enables cost-efficient testing of display driver ICs for high-resolution flat-panel displays, combining advanced test capabilities and high throughput

High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.

Versatile and extendible

The T6391 provides wide test coverage for all types of applications including analog, memory and logic circuits with high pin counts and high-speed interfaces. This versatility stems from the system's pin-card design, which makes it the best test solution for both engineering and production applications.

This tester was developed to address both the current and future needs of customers worldwide. It is capable of testing Touch and Display Driver Integration (TDDI), PMIC functions embedded within DDIs, a projected advancement in next-generation devices. To optimize its operation and cost efficiency, the system uses the same TDL programming environment as other testers in ADVANTEST's T6300 product family.

Greater operating efficiency for high throughput

The system can test several devices in parallel and perform large-volume testing of high-resolution DDIs with up to 3,584 pins, including those used in full high-definition (Full HD), QHD and 4K displays. Industry-leading throughput is enabled by the T6391's high-speed bus, which enhances data transfer and calculation speeds with its 1,024 I/O channels.

A test solution for advanced ICs

To test DDIs using the MIPI interface, the standard protocol for mobile electronics, the T6391 can handle I/O pin frequencies up to 1.6 Gbps. When equipped with an additional UHSIF measurement module, high-speed interface testing even over 6.5 Gbps, required for DDIs for ultra-high-definition televisions including the 4K/8K generation, will become possible.

Major Specifications

Target devices All kinds of DDIs and TDDIs, as well as DDIs and TDDIs for high resolution OLEDs
*TDDI integrates touch functionality with DDI
LCD measurement 3,584 channels (maximum), per-pin DGT and per-pin PMU
Digital I/O Up to 1,024 channels, 1.6 Gbps
Faster interface 6.5 Gbps or higher