The Advantest Cloud Solutions™ (ACS) ecosystem helps customers accomplish intelligent data-driven workflows. The ACS open solution ecosystem, a family of cloud-based products and services, is based on a single scalable data platform, which enables customers to develop or procure market-leading solutions from Advantest and its partners. Using these real-time machine learning, market-leading solutions, customers can automate turning insights into production actions in an easy-to-use and accessible way across the entire semiconductor value chain. For more information, see the list of current solutions below.
ACS RTDI™ is a solution platform that securely collects, analyzes, stores and monitors semiconductor test data and empowers customers to automate the process of converting insights into actionable production steps within the same test insertion in milliseconds.
Advantest ACS Dynamic Parametric Test™ (DPT) powered by PDF Exensio® focuses on DC parametric test, also known as WAT or e-Test, typically performed in-line during wafer fabrication and end-of-line when wafers are shipping from fab to wafer sort.
Advantest's ACS Adaptive Probe Cleaning™ (APC) solution is an industry-first approach that uses artificial intelligence (AI) algorithms to clean probe needles on an as-needed basis, lengthening probe card lifetime, improving wafer test yield and reducing test costs.
ACS EASY™ is offering a new low-cost yield-improvement solution that leverages artificial intelligence (AI) to expedite identifying the root causes of yield loss and increase the efficiency of analyzing test results.
Advantest's ACS TE-Cloud™ is a one-stop test engineering solution platform, offering a complete test development environment with an integrated set of software tools for V93000 test program development.
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