ST System
ST System is a test equipment suitable to verify stability or drift of all static parameters of discrete power semiconductors.
The system is defined “sequencer” because it allows to execute test measurements before and after a stress sequence (heating and cooling), on up to 60 devices in parallel, by a single start command. It is featured with an interface to an automatic handler to automatically manipulate, contact and cool the devices to be tested (DUT).
MT System
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR, SiC, GaN, etc) packaged and unpackaged (discrete, module and substrate).
The system is defined “automatic tester” because it can execute large sequence of measurements stored in a test program file by a single start command. They are featured with an interface to automatic handlers to automatically manipulate any kind of packaged or unpackaged DUT.
Choice your better test solution from MT testers with its ranges of voltages and currents cover test requirement of static parameter from DIEs to complex configuration of modules. MT testers adding dynamic and combined parameters test capabilities that reach ranges up to 10 kV and 10 kA, to satisfy strongest requirements of the market.
CREA S.r.I
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