Application Training course list
SOC Test System – V93000 (SmarTest 7)
課程代號 | 課程名稱 | 天數 | 先修課程 | 課程簡介 |
---|---|---|---|---|
V93000 I-SMT7 | V93000 SOC Digital User Training (SmarTest 7) |
5 | 無 | Enable students to create semiconductor test programs on the V93000 SOC Test Platform. The intent is to provide the skills required to utilize the V93000 Tester Platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. After completion the student will be familiar with the following: (1) Key concepts and components of the V93000 (2) Setup basic Digital Test Programs (3) Pin configuration setup of Levels, Timing and Vectors (4) Calibration, Testflow, Test Methods, Debugging tools and concepts (5) DC Testing, Shmoo tools, Data logging, Histograms |
V93000 MST-SMT7 | V93000 SOC Mixed Signal User Training (SmarTest 7) |
4 | *V93000 I-SMT7 | After completing this training, the participant will be familiar with the use of instruments to test mixed signal performance parameters and specifications in the V93000 SOC Series. You will know the steps to: (1) Enable students to develop mixed signal device test programs on the V93000 SOC Test Platform. The intent is to provide the skills required to utilize the V93000 Tester Platform as an integral tool in the engineering and production flows of mixed signal device manufacturing. (2) The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. (3) Develop test programs for mixed-signal devices (4) Use the available tools for developing and debugging mixed-signal |
V93000 PS RF-SMT7 | V93000 SOC Port Scale RF User Training (SmarTest 7) |
5 | *V93000 I-SMT7 *V93000MST-SMT7 |
先修課程 Pre-requisites: The prerequisite for this class is the content of the 93000 Basic User Training class and the 93000 Mixed Signal Training class. It is expected that the students have a good understanding of RF fundamentals prior to attending this class. 課程目標 Course Object: The purpose of the 93000 Port Scale training series is to enable students to develop and use RF test programs based on 93000 Port Scale RF test system On completion of the course, participants: • know HW specification and structure of PSRF subsystem • know how to use software tool to create and measure a CW/Mod signal • know how to do RF calibration • know how to use RF API in Testmethod • know how to do an RF to BB setup & measurement |
V93000 Production- SMT7 | V93000 SOC Production Setup Training (SmarTest 7) |
2 | *V93000 I-SMT7 | The purpose of the V93000 SOC User Training for production setup is to enable students to operate and support production setup activities based on V93000 system. 適合對象 Target Audience: (此為初階課程, 適合新進人員) - Test Engineers - Product Test engineers - Production System Administrator On completion of the course, participants: (1) will be familiar with and know how to setup/configure production test environment including OS, Smartest and Licensing. (2) know how to create or maintain key components for enabling V93000 production including work-order, Prober/Handler driver and Application Model (3) know how to gather and analyze production data, including GDF,STDF,EDF (4) know the Test cell integration solution including Prober/Handler driver interface |
V93000 TP-SMT7 | V93000 SOC Test Program Development Training (SmarTest 7) |
4 | *V93000 I-SMT7 *V93000MST-SMT7 |
先修課程 Pre-requisites: V93000 Digital User Training, V93000 Mixed Signal Training, Others: C/C++ programming language 適合對象 Target Audience: Test engineer who needs to develop SOC or high speed test program 課程目標 Course Object: (1) This course focus on test program development by using C/C++ style UTM Testmethod coding. (2) The purpose of this course is to demonstrate the C/C++ example code by using Testmethod APIs and standard C/C++ library, which includes DC, AC and Mixed-Signal Testing items. (3) The example Testmethod codes cover up most frequently used test items among the SOC test program, which helps inexperienced test engineer to reduce test program development time. (4) Testmethod program made easy by simple, clear ,and device independent examples. |
SOC Test System – V93000 (SmarTest 8)
課程代號 | 課程名稱 | 天數 | 先修課程 | 課程簡介 |
---|---|---|---|---|
V93000 I-SMT8 | V93000 SmarTest 8 Basic User Training | 5 | 建議熟悉 Fundamental Digital Testing | Enable students to create semiconductor test programs on the V93000 Test Platform under SmarTest 8 software. The intent is to provide the skills required to utilize the V93000 Tester Platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. After completion the student will be familiar with the following: (1) Key concepts and components of the V93000 system (2) Understanding of the SmarTest8 SW concepts and how to use them (3) Setup of test programs using the SmarTest 8 features (4) The setups of Signals, Levels, Timing and Vectors (5) Operating Sequence, Testflow, Test Methods, Debugging tools and concepts (6) DC Testing, Shmoo tools, Data logging, Test tables, Utility lines |
V93000 WS MX/RF | V93000 SmarTest 8 Wave Scale MX and RF User Training | 3 | *V93000I- SMT8 | 先修課程 Pre-requisites: The prerequisite for this class is the content of the 93000 SmarTest8 Basic User Training class. It is expected that the students have a good understanding of RF and mixed signal fundamentals prior to attending this class. 適合對象 Target Audience: Test engineers or Product Test engineers who need to develop or support SmarTest8 Wave Scale MX and RF Test program on V93000. 課程目標 Course Object: The purpose of V93000 SmarTest8 Wave Scale MX and RF User Training series is to enable students to develop and use RF/Mixed Signal test programs based on V93000 SmarTest8 Wave Scale MX and RF test system. On completion of the course, participants: (1) Know specification, pogos, cabling, and interface of hardware in WSMX/RF. (2) Know how to use SMT8 software to create loopback measurement of WSMX/RF. (3) Know how to use device setup API in SMT8. (4) Know the calibration of WSMX/RF. |
V93000 Production- SMT8 | V93000 SmarTest 8 Production Integration User Training | 2 | *V93000I- SMT8 | Enable the user to use ST8 tools to setup a TestCell and run Production. 適合對象 Target Audience: - Test Engineers - Product Test engineers - Production System Administrator After completion the student will be familiar with the following: (1) SMT8 Test Program release to production, including process and usage of workspaces. (2) Test Cell control using TCCT for production engineering. (3) Setup of Test Cell for hand testing using TCCT Recipe setup. (4) Understand how Test Cell related variables can be setup to store production data and how Test Programs can have access to them. (5) Setting-up and simulate Test Cell for testing with a Handler or Prober in offline. Lecture 1: Overview of SMT8 TestCell Lecture 2: SMT8 Test Program release to production Lecture 3: Test Cell control using TCCT for production engineering Lecture 4: Test Cell control using Recipe Lecture 5: Test Cell related variables Lecture 6: Setting-up Test Cell for testing with a Handler or Prober Lecture 7: Typical challenges in real production |
Java | Java Basics Training | 2 | 無 | 適合對象 Target Audience: Those who want to study Smartest 8 TML furtherly. 課程目標 Course Object: (1) Provide the basics of Java programming language (2) Demonstrate the basics of using Smt8 EWC for writing Java programs (3) Practice Java fundamental examples (4) Introduce Java programming structure of Smt8 basic testmethod library |
SOC Test System – T2000 / T6300 LCD Driver
課程代號 | 課程名稱 | 天數 | 先修課程 | 課程簡介 |
---|---|---|---|---|
T2000 | T2000 Basic Programming Training | 3 | 無 | 測試程式開發基礎課程 1. 愛德萬測試T2000系統軟硬體架構介紹. 2. Simulator(R3.05)系統操作環境, 學習ATCP測試程式架構, 並能撰寫簡單的測試程式. 課程內容: (1) Hardware and software overview (2) T2000 simulator operation (3) OTPL programming using Advantest Test Class Template Package (4) Test classes code using ATF kit APIs |
T6300 | T6300 Series (LCD driver IC) TDL Programming Training | 5 | 無 | 先修課程 Pre-requisites: Familiarity with methodologies of digital IC test as well as with Unix system and Text Editors, etc. 適合對象 Target Audience: No experience in testing or T6300 serial. 課程目標 Course Object: This class introduces participants to the T6300 series. Include T6371, T6372 and T6373. Upon completion you will: (1) understand hardware structure of the T6300 series (2) be able to create test programs for LCD driver IC (3) know how to generate and analyze test results (4) know how to debug devices and/or test programs |
Memory Test System
課程代號 | 課程名稱 | 天數 | 先修課程 | 課程簡介 |
---|---|---|---|---|
T5000 ATL | T5000 Series ATL Programming Elementary Training | 4 | 無 | To provide trainees to learn how to start using ADVANTEST memory tester with a simple description of the mechanism, operation and programming. This is achieved through a combination of lectures and lab execises. The training course coverage is: (1) ADVANTEST T5000 memory tester SW/HW overview (2) Main program/socket program/pattern program introduction in ATL (3) FutureSuite basic operation (4) FutureSuite debug/characterization tools (5) Lab exercises covering simple DC test and function test |
T5000 MCI | T5000 Series MCI Programming Basic Training | 4 | 無 | Enable the trainees to know the general MCI language skeleton and how to use it to make DC/Function test program under FutureSuite series system. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. After completion the trainees will be familiar with the following: (1) Key concepts and components of the T5000 series tester. (2) Setup basic test condition with MCI. (3) Be able to develop test program in MCI (4) Calibration, Testflow, Data logging ,Debugging tools and concepts |
T5000 HS DDR4 | T5833/T5503 HS DDR4 Test Programming Training | 4 | T5000 ATL | This course introduces T5833/T5503HS software and hardware capability. The trainee learns how to develop solutions for DDR4 using the hardware feature of T5833/T5503HS test system. This is achieved through a combination of lectures and lab execises. The training course coverage is: (1) DDR4 key specification introduction (2) Test program transfer notice (3) Sourcesync (4) Fixed delay edge mode (5) UBM (6) Hardware timing training (7) CRC,DBI (8) CA parity (9) Lab exercises covering test solution for DDR4 |
T5830 MCI | T5830 MCI Flash Programming Training | 4 | T5000 MCI | Enable students to create MCI test programs on the T5830 Tester. The intent is to provide the skills required to utilize the T5830 Tester as an integral tool in the engineering and production flows of NAND and NOR device manufacturing. The training described herein serves as an introduction to the functional and operational features. After completion the student will be familiar with the following: (1) Understand key concepts and test system features of the T5830. (2) Be able to develop T5830 test programs in MCI (3) Realize FCM/CFM/BBM/UBM/DBM usage (4) Realize how to generate and analyze test results (5) Realize how to debug devices and/or test programs |
*若有課程需求,請與台灣教育訓練中心聯繫。
愛德萬測試股份有限公司 台灣教育訓練中心
聯絡人: 余惠菁 Dana Yu
報名專線: 03-5975723
傳真專線: 03-5981133
Email報名: dana-hj.yu@advantest.com
上課地點: 新竹縣湖口鄉新竹工業區光復路15號