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Sep 18, 2017 Topics

VOICE Returns to San Diego, California and Hsinchu, Taiwan in May 2018

TOKYO, Japan - September 18, 2017 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has issued an international call for papers for the VOICE 2018 Developer Conference focusing on innovative test solutions for system-on-chip (SoC) and memory semiconductor devices, handler solutions, best practices and hot topics. The 2018 conference will return to the 2016 host cities of San Diego, CA and Hsinchu, Taiwan on May 15-16 and on May 23, respectively, under the unifying theme “Measure the Connected World... and Everything in ItSM.”

For the past 11 years, VOICE has been an engineering conference, created by test engineers for test engineers. VOICE 2018 will again offer attendees learning and sharing opportunities with technical presentations, keynote speakers, a partners’ exposition, a technology kiosk showcase and social gatherings in both locations.

“In 2018, VOICE attendees will have the opportunity to return to two of their favorite locations - San Diego, California and Hsinchu, Taiwan,” said Angelina Lemon, i.MX test engineer - senior principal engineer at NXP Semiconductors and VOICE 2018 chairperson. “We also are returning to an even richer technical program format that features high-quality sessions covering timely topics and more networking time to discuss these topics. In the last year, we have seen huge steps made in 5G communications, artificial intelligence and autonomous vehicles, which also create new challenges for automated testing. VOICE brings together different perspectives and expertise about these challenges and more. This event provides an environment that is perfect for sharing knowledge that attendees can apply immediately in their daily work. I look forward to welcoming Advantest users and partners to VOICE 2018.”

Advantest's VOICE 2018 call for papers focuses on six technology tracks:

Device/System Level Test

specific devices and system level test; MIMO; mmWave; next-generation embedded processors; broadband fiber to the home; autonomous vehicles IC test; multi-chip system-in-package

Internet of Things (IoT)

IoT enabling technologies; mobility, 5G, wireless, RF, wearables; smart cities/homes; sensors; tactile internet

Test Methodologies

supporting standards and protocols; solutions for the latest testing challenges

Hardware & Software Design Integration

utilizing the latest hardware or software features; test cells; new test system enhancements

Optimizing Productivity

cost of test; throughput; time-to-market; semiconductor “supercycle”

Hot Topics

new market drivers and future trends; artificial intelligence; smart data innovation; secure ID and cyber security; secure cloud; video streaming/telepresence

Test developers can submit their abstracts to be considered for presentation in California, Taiwan or both locations. All submissions must be received by October 20, 2017 at Accepted presenters will be notified in November 2017. Attendees at the conference sessions in May 2018 will vote for the best papers via the VOICE mobile app, with winning presenters receiving prizes during the closing awards ceremony.

For more information about the VOICE 2018 Developer Conference, visit or email Information about sponsorship opportunities will be available soon.

About Advantest VOICE 2018

Managed by a steering committee of volunteer representatives from Advantest and its customers, VOICE is the leading conference for the growing international community of users and strategic partners involved with Advantest’s V93000 and T2000 SoC test platforms as well as Advantest memory testers, handlers and test cell solutions. The conference offers a unique opportunity to take part in making semiconductor testing operations as efficient and cost effective as possible. Attendees gain and share valuable insights, build long-lasting relationships and learn what’s new about Advantest test equipment, handlers and applications.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.