Skip to Content
Go to Advantest

  • Home

  • About ADVANTEST

    About ADVANTEST

    • CEO Message
    • Corporate Overview
    • Mid/Long-Term Management Policy
    • Why Advantest
    • History
    • Offices / Subsidiaries
    • Management
    • The Advantest Way
    • Integrated Annual Report

  • Products

    Products

    • SoC Test Systems
    • Memory Test Systems
    • Test Handler
    • Device Interface
    • SEM Metrology / Review
    • SSD Test Systems
    • Terahertz Systems
    • Electronic Measuring Instruments
    • System Level Test Systems
    • Leading Edge Products
    • Test Cell and Automation Solutions
    • CloudTestingTM Service
    • Advantest Group Products

  • Global Services

    Global Services

    • Consulting Services
    • Uptime Services
    • Product Support
    • ADVANTEST CONNECT+
    • Customer Service Web Portal

  • Investors

    Investors

    • Management Information
    • Governance
    • Financial Highlights
    • IR Library
    • Shares and Corporate Bonds
    • Individual Investors
    • Related Information
    • IR Calendar

  • Sustainability

    Sustainability

    • Advantest's Sustainability
    • Environment
    • Society
    • Governance
    • Data Book
    • ESG Data
    • Guideline Comparison Table
    • Disclosure Policy

  • Careers

    Careers

    • Americas
    • China (中国)
    • Europe
    • Japan (日本)
    • Southeast Asia / South Asia
    • South Korea (한국)
    • Taiwan (台灣)
  • Advantest Cloud Solutions
  • myAdvantest
  • Contact
    • 日本語
    • 简体中文
    • 繁體中文
Search

Products

  • SoC Test Systems
  • Memory Test Systems
  • Test Handler
  • Device Interface
  • SEM Metrology / Review
  • SSD Test Systems
  • Terahertz Systems
  • Electronic Measuring Instruments
  • System Level Test Systems
  • Leading Edge Products
  • Test Cell and Automation Solutions
  • CloudTesting™ Service
  • Advantest Group Products
  • Home/
  • Products/
  • Terahertz Systems/
  • Related Information/

Related Information

  • About Terahertz Waves

  • Spectroscopic Imaging:
    Broad Application Coverage

  • Imaging Analysis:
    Non-invasive measurement of specimen interior structures

  • Product Catalog

top
  • About ADVANTEST
  • CEO Message
  • Corporate Overview
  • Mid/Long-Term Management Policy
  • Why Advantest
  • History
  • Offices / Subsidiaries
  • Management
  • The Advantest Way
  • Integrated Annual Report
  • Products
  • SoC Test Systems
  • Memory Test Systems
  • Test Handler
  • Device Interface
  • SEM Metrology / Review
  • SSD Test Systems
  • Terahertz Systems
  • Electronic Measuring Instruments
  • System Level Test Systems
  • Leading Edge Products
  • Test Cell and Automation Solutions
  • CloudTestingTM Service
  • Advantest Group Products
  • Advantest Cloud Solutions (ACS)
  • ACS
  • ACS TE-Cloud
  • ACS Edge
  • ACS DPT
  • ACS APC
  • ACS Nexus
  • ACS EASY
  • Global Services
  • Consulting Services
  • Uptime Services
  • Product Support
  • ADVANTEST CONNECT+
  • Customer Service Web Portal
  • Investors
  • Management Information
  • Governance
  • Financial Highlights
  • IR Library
  • Shares and Corporate Bonds
  • Individual Investors
  • Related Information
  • IR Calendar
  • Sustainability
  • Advantest's Sustainability
  • Environment
  • Society
  • Governance
  • Data Book
  • ESG Data
  • Guideline Comparison Table
  • Disclosure Policy
  • Careers
  • Americas
  • China (中国)
  • Europe
  • Japan (日本)
  • Southeast Asia / South Asia
  • South Korea (한국)
  • Taiwan (台灣)
  • News
  • Event Calendar
  • VOICE
    (Developer Conference)
  • Probo
    (Technical Magazine)
  • GO SEMI & BEYOND
    (Newsletter)
  • Advantest Talks Semi Podcast
  • LIFE. ON.
  • Knowledge Booster Videos!
    Learn All About Semiconductors
  • facebook
  • twitter
  • linkedin
  • youtube

Advantest Corporation
TSE: 6857

  • Contact
  • Compliance hotline
  • Terms of Use
  • Advantest Privacy Policy
  • Sitemap

Copyright ADVANTEST CORPORATION

We use strictly necessary cookies to make our site work.

For more information, refer to Advantest Global Privacy Policy.

OK