New HF-AWGD Module Enables Fast, Easy Debugging and Verification of Highly Precise 16-bit ADCs and Operational Amplifiers
TOKYO, Japan – February 28, 2017 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced the new HF-AWGD (high-frequency arbitrary waveform generator and digitizer) module to extend the capabilities of its EVA100 measurement platform to include high-resolution and high-speed analog devices. With the new module, the EVA100 system can measure all key parameters of mixed-signal, precision and standard analog semiconductors used in high-growth applications including on-board automotive electronics.
Equipped with both a high-speed, dual-channel arbitrary waveform generator and digitizer, the HF-AWGD module is a powerful analysis tool for precision devices such as 16-bit ADCs and operational amplifiers. The module employs intuitive software and high-speed sampling to generate waveforms by either AWG mode (wave pattern file base) or pattern generator mode (without using wave pattern files). The AWG system's ultra-low harmonic distortion of -102 dB enables superior precision. In addition, the large waveform memory can capture large samples while the built-in digitizer provides coverage across a wide input range with high analog bandwidth to address classes of precision and high-speed converters and wireless baseband devices.
"Our new HF-AWGD module expands the range of our proven EVA100 measurement system while offering simplified set up along with quick debugging and verification for faster product launches," said Satoru Nagumo, managing executive officer at Advantest Corporation. "Its integrated design and leading performance make it well suited for measuring smart devices that combine analog and digital functions on a single IC. These types of devices are in high demand for applications such as sensing, mobile communications and power management."
Advantest's EVA100 system uses the same test sequences for both design and production measurements, enabling users to establish a standardized measurement environment throughout their operations. This contributes to dramatically shorter time to market by allowing semiconductor manufacturers to avoid spending time and resources correlating test data from different systems. The EVA100 also uses an intuitive GUI so no complicated programming language is needed.
HF-AWGD modules have already been installed at several customer sites to measure image sensors, data converters and other devices.
EVA100 Measurement System
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.