ACS Real-Time Data Infrastructure (ACS RTDI™)｜Advantest Cloud Solutions™

ACS Real-Time Data Infrastructure (ACS RTDI™) is a solution platform that securely collects, analyzes, stores and monitors semiconductor test data and empowers customers to automate the process of converting insights into actionable production steps within the same test insertion in milliseconds.

THE ACS MISSION:

ACS enables customers to optimize yield, improve quality, and reduce time to volume / market with ACS Real-Time Data Infrastructure (ACS RTDI™) and AI/ML-Driven Analytics Solutions.

About ACS RTDI™

The Future is Now

Enables integrated workflow that seamlessly connect data between different insertions
Transports data in a secure environment to deliver results in milliseconds
Helps customers realize integrated data-driven workflows
Allows customers to leverage the single scalable data platform to develop in-house applications or adopt market-leading solutions
Enable in-line decisions to be executed during production, resulting in increased productivity and enhanced quality

ACS RTDI conceptual diagram. It is a real-time data infrastructure that securely collects, analyzes, stores, and monitors semiconductor test data. The application is securely loaded from the container to the Edge Server. Test results and analysis data are also encrypted and sent to the Edge Server. They are processed by the algorithm and the results are returned to the test program.

Features:

Integrates data sources across the IC manufacturing supply chain
Offers low latency edge computing and analytics in a True Zero Trust™ secured environment
Enables AI/ML-driven decision-making within the same test insertion in milliseconds
Open solutions ecosystem allows customers to create and implement analytics models
Reliable and secure, ensuring hassle-free OS revisions
Enables multiple apps from ecosystem partners on a single platform
Compatibility across all Advantest platforms

Get the RTDI™ white paper below:

RTDI™ white paper_{（PDF 998KB）}

Use Cases:

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Outlier Detection

Improves quality and reliability by analyzing data in real-time with complex analytics to identify likely quality and reliability failures to prevent overkill.

Adaptive Test

Reduces cost and improves OEE by predicting likely outcomes by adding, removing, or altering test content and methods on-the-fly in order to optimize the use of critical test resources on a part-by-part basis.

Predictive Binning

Predictive binning saves the costs and time of unnecessary testing by identifying and skipping at-risk devices earlier in the test flow, improving quality and/or reliability.

ACS Real-Time Data Infrastructure (ACS RTDI™)