Advantest to Showcase its Newest IC Memory Testers and Measurement Systems at the SEMICON Korea Trade Show, January 27-29 in Seoul

A Variety of New-to-Market Systems Will Be on Display in the Booth

CHEONAN, South Korea – January 19, 2016 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) will spotlight its newest memory test solutions and measurement tools at the SEMICON Korea trade show, being held January 27-29 at the Coex Convention and Exhibition Center in Seoul.

Advantest's booth #1210 in Hall C will include exhibits of its latest products for the growing semiconductor memory market, including the T5833 and T5851ES testers as well as the MPT3000 engineering system for testing and developing solid-state drives (SSDs).

Also on display will be the EVA100 measurement system for sensors, analog ICs and mixed-signal semiconductors and the common sub-board that enables this system to be used in either production or engineering applications.

Advantest will highlight its latest system-on-chip (SoC) test handler and M4871ES Tri-Temp Hand Plug Unit, designed to reduce cycle times and improve yields in testing SoC devices will be featured as well as Advantest's TAS product series of terahertz-wave spectroscopy and imaging-analysis systems.

Keep up to date on these new systems and all the latest developments from Advantest by following the company on Twitter @Advantest_ATE.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.