Testing Services Provider Uses Advantest’s V93000 Systems to Evaluate Semiconductors from Several Silicon Valley Chip Makers
TOKYO, Japan – February 21, 2018 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has received a supplier excellence award from iTest Inc., a Silicon Valley-based start-up providing reliable and leading-edge semiconductor testing services, in recognition of the overall value delivered in the first year of the companies’ strategic partnership. The award was presented to Todd Delvecchio, director of sales with Advantest, by iTest’s CEO Rabbi Islam at the year-end supplier-recognition and customer-appreciation event at iTest’s headquarters facility in Milpitas, California.
The testing services company has purchased and installed four of Advantest’s V93000 test systems, which includes the entire solution set offered by V93000 Smart Scale test systems, to evaluate a variety of devices including network processors, high-bandwidth interfaces and IoT devices for multiple semiconductor companies with operations in Silicon Valley.
“The first-rate performance and productivity delivered by the V93000 platform is matched only by the dedicated service and support that Advantest has provided this past year,” said iTest’s Islam. “I’m pleased to report that since the testers were installed a year ago, they have logged zero failures after rigorous usage.”
“As we move into 2018, we look forward to continuing our successful partnership with iTest,” said Advantest’s Delvecchio. “It’s very gratifying to receive the award, but even more rewarding to see how our test solutions are enabling our customers to grow and become leaders in their market segments.”
Designed for testing different ICs on a single system, the V93000 platform fulfills the test requirements for a large variety of customers and device types, from engineering through volume production. It is the most cost-efficient test solution for all advanced semiconductor designs including high-speed, radio-frequency, mixed-signal, analog and power ICs. With the tester’s universal per-pin architecture, each pin can run with its own clock domain, providing full test coverage by matching the exact data-rate requirements of the device under test. In addition, the V93000 platform’s scalability allows it to address a variety of test methodologies and quality requirements, giving it a long usable lifetime for maximum ROI and reduced risk.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.