New Test Solutions for Wireless Devices are Available as Upgrades on Advantest's T2000 Test Platform
TOKYO, Japan - March 10, 2014 - Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest's widely used T2000 platform.
The new modules use vector signal generation (VSG) and vector signal analysis (VSA) software to meet the wide-range modulation challenges presented by today's most advanced portable electronics. Each module offers a wide modulation bandwidth of 80 MHz combined with waveform generator software and modulation analysis software for 802.11ac and LTE-Advanced protocols.
"With these new modules, we are continuing to provide our customers with the versatile test solutions they need to address high-volume wireless communication markets with minimal investment," said Dr. Toshiyuki Okayasu, executive officer and executive vice president, SoC Test Business Group at Advantest Corporation.
The flexible T2000 platform has a scalable architecture that allows customers to change modules and configure the system to test virtually any semiconductor devices. This enables the tester to match both current and future testing requirements, whereas most other testers must be locked into a dedicated equipment configuration. The T2000 family of test systems is used in the world's most advanced semiconductor design and production lines by integrated device manufacturers, fabless companies and outsourced semiconductor assembly and test (OSAT) foundries around the world.
Shipments of Advantest's T2000 WLS32-A and WLS16-A modules are expected to begin in the second quarter of this year.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change.