News News

2018-07-09 07:05:00.0 Topics

TOKYO, Japan – July 9, 2018 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will be active on the exhibit floor, in the technical program and in the classroom at SEMICON West 2018, coming July 10-12 to Moscone Center in San Francisco.
“In addition to exhibiting our latest IC test solutions for a wide range of applications, we will present two technical papers and take part in the first High Tech U program to be held during the SEMICON West tradeshow,” said Judy Davies, Advantest’s vice president of global marketing communications.

Product Displays

In booth #1105 in South Hall, Advantest will showcase its new FVI16 floating power VI source, which gives the V93000 single scalable platform the industry’s best VI signal performance. Providing 250 watts of high-pulse power and up to 40 watts of DC power, the FVI16 module enables the V93000 system to test high-site-count ICs with higher voltages, increased channel counts and greater power demands, opening new market opportunities in power-management applications.

Also on display will be the new T5503HS2 tester for DDR5 and LPDDR5 memories used throughout mobile electronics and servers. This test solution, available as a new system or as an upgrade on existing T5503 units, can test devices at speeds as high as 8 Gbps, sufficient to handle the maximum operating frequencies of today’s most advanced double-data-rate SDRAM semiconductors. It can test up to 512 DDR5 devices in parallel for high productivity at a low cost of test.

The booth will feature the T2000 Integrated Power Device Test Solution (IPS) with two new modules for testing analog ICs for the hybrid/EV automotive market. The modules can measure voltages up to 300V with accuracy of 100uV. Module resources can be stacked or ganged, giving customers the ability to adjust the tester’s functionality and throughput to achieve their desired performance. This versatility helps to ensure long-term usability.

Other exhibits will include the EVA100 measurement system for production-volume testing of analog, digital and mixed-signal devices and the small-footprint M4171 handler that improves lab efficiencies with its capability of being operated remotely from anywhere in the world. Video presentations will highlight Advantest’s Wave Scale generation of test solutions, the MPT3000 platform’s system-level testing capabilities for SATA, SAS, and PCIe solid-state drives (SSD), and advanced test solutions for the Internet of Things (IoT).

Technical Participation

In addition to product exhibits, Advantest will play an active role in SEMI’s technical program and the annual Test Vision 2020 workshop, held concurrently with SEMICON West. Derek Floyd, director of business development at Advantest, serves as Test Vision 2020’s program chair and an Advantest technical expert will present two papers during the two-day event, held in room 20 of North Hall. On Wednesday, July 11 at 11:25 a.m., Kotaro Hasegawa, senior director of the system planning department in Advantest’s ADS Business Group, will deliver a talk on “Automotive IC Testing for Autonomous Cars.” He also will present a paper on “28-GHz 5G RF Test Experiences” on Thursday, July 12 at 3:10 p.m.

Workforce Development

Looking to the future, Advantest will co-sponsor the first SEMI High Tech U program to be held in conjunction with SEMICON West. The program on July 10-12 helps students aged 15 to 17 years old to better understand the semiconductor industry, explore career possibilities and see the industry up close by visiting some exhibitors’ booths.
Advantest personnel will teach three of the program’s modules – including one that Advantest and KLA-Tencor helped to develop on IoT and artificial intelligence (AI) – as well as conduct practice interviews with students and emcee the final day of activities.

Follow Advantest on Social Media

Stay connected with Advantest for all the latest information on IC test solutions on Twitter @Advantest_ATE.

Note: All information supplied in this release is correct at the time of publication, but may be subject to change without warning.