Versatile System Being Applied in Testing Current AMD CPUs and Will be Used to Evaluate Upcoming Generation of Server Processors
TOKYO, Japan – October 3, 2018 – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has installed its 3,000th V93000 Smart Scale test system for use by its long-term customer AMD, in evaluating AMD Ryzen™, AMD Radeon™ and AMD EPYC™ compute, graphics and data center products.
“Our two companies enjoy a long-standing collaboration that enables AMD to deliver leading technology solutions, so it’s very fitting that this milestone system is being reached with AMD,” said Corbett Zabierek, senior director, Procurement and Sourcing, AMD. “We utilize hundreds of Advantest V93000 testers to evaluate next-generation technology and drive cost-efficiency improvements in volume production of our leading-edge integrated circuit technologies.”
“The V93000 Smart Scale systems delivers both high performance and a low cost of test, making it the leading test solution for high-end computing, graphics and machine-learning devices,” said Hans-Juergen Wagner, executive vice president, ATE Business Group, Advantest. “Since its introduction nearly two decades ago, our scalable V93000 Platform has continuously generated market wins among leading digital semiconductor providers around the world and expanded our presence into the top automotive, analog and mixed-signal semiconductor companies.”
With its testing efficiency and cost effectiveness, the V93000 Smart Scale system provides the right mix of capabilities to help customers get to market faster with their newest products for applications including cloud servers and high-resolution gaming graphics. The flexible platform is designed to meet the full range of complex digital-test requirements, from 7-nm design rules to 32-Gbps data rates and beyond. Digital cards are complemented with high current power supplies, which offers best-in-class load step response performance for high-current cores and multi-power domains.
Note: All information supplied in this release is correct at the time of publication, but may be subject to change.